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Daisuke IKEFUJI
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Activity support apparatus, activity support method, and computer r...
Patent number
12,211,361
Issue date
Jan 28, 2025
NEC Corporation
Shigeki Shinoda
G08 - SIGNALLING
Information
Patent Grant
Activity support apparatus, activity support method, and computer r...
Patent number
12,211,332
Issue date
Jan 28, 2025
NEC Corporation
Shigeki Shinoda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processing apparatus, image processing method, and non-transi...
Patent number
12,176,112
Issue date
Dec 24, 2024
NEC Corporation
Gaku Nakano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radar device, imaging method, and imaging program
Patent number
12,085,666
Issue date
Sep 10, 2024
NEC Corporation
Tatsuya Sumiya
G01 - MEASURING TESTING
Information
Patent Grant
Radar signal imaging device, radar signal imaging method, and radar...
Patent number
11,933,885
Issue date
Mar 19, 2024
NEC Corporation
Kazumine Ogura
G01 - MEASURING TESTING
Information
Patent Grant
Synthetic aperture radar signal processing device and signal proces...
Patent number
11,841,422
Issue date
Dec 12, 2023
NEC Corporation
Daisuke Ikefuji
G01 - MEASURING TESTING
Information
Patent Grant
Synthetic aperture radar image analysis system, synthetic aperture...
Patent number
11,841,421
Issue date
Dec 12, 2023
NEC Corporation
Taichi Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Synthetic aperture radar signal analysis device, synthetic aperture...
Patent number
11,835,619
Issue date
Dec 5, 2023
Daisuke Ikefuji
G01 - MEASURING TESTING
Information
Patent Grant
Synthetic-aperture-radar image processing device and image processi...
Patent number
11,754,704
Issue date
Sep 12, 2023
NEC Corporation
Daisuke Ikefuji
G01 - MEASURING TESTING
Information
Patent Grant
Synthetic-aperture-radar-signal processing device, method, and program
Patent number
11,662,459
Issue date
May 30, 2023
NEC Corporation
Daisuke Ikefuji
G01 - MEASURING TESTING
Information
Patent Grant
Synthetic aperture radar signal processing device and method
Patent number
11,460,573
Issue date
Oct 4, 2022
NEC Corporation
Daisuke Ikefuji
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
Publication number
20250087368
Publication date
Mar 13, 2025
NEC Corporation
Gaku Nakano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DISTRIBUTED OPTICAL FIBER SENSING (DFOS) SYSTEM AND METHOD OF USING...
Publication number
20250037575
Publication date
Jan 30, 2025
NEC Corporation
Hemant Shivsagar PRASAD
G08 - SIGNALLING
Information
Patent Application
ACTIVITY SUPPORT APPARATUS, ACTIVITY SUPPORT METHOD, AND COMPUTER R...
Publication number
20240212470
Publication date
Jun 27, 2024
NEC Corporation
Shigeki SHINODA
G08 - SIGNALLING
Information
Patent Application
DISTRIBUTED OPTICAL FIBER SENSING (DFOS) SYSTEM AND METHOD OF USING...
Publication number
20240201007
Publication date
Jun 20, 2024
NEC Corporation
Hemant Shivsagar PRASAD
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NONTRANSIT...
Publication number
20240020837
Publication date
Jan 18, 2024
NEC Corporation
Gaku Nakano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
Publication number
20230307138
Publication date
Sep 28, 2023
NEC Corporation
Gaku Nakano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
Publication number
20230298166
Publication date
Sep 21, 2023
NEC Corporation
Gaku Nakano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
Publication number
20230274553
Publication date
Aug 31, 2023
NEC Corporation
Gaku Nakano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
Publication number
20230230380
Publication date
Jul 20, 2023
NEC Corporation
Gaku Nakano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
JUDGMENT SUPPORT APPARATUS, JUDGMENT SUPPORT METHOD, AND COMPUTER-R...
Publication number
20230083818
Publication date
Mar 16, 2023
NEC Corporation
Shigenori BEPPU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PROVIDING METHOD
Publication number
20230017248
Publication date
Jan 19, 2023
NEC Corporation
Daisuke Ikefuji
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PREDICTION METHOD
Publication number
20230005258
Publication date
Jan 5, 2023
NEC Corporation
Shigeki SHINODA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADAR DEVICE, IMAGING METHOD, AND IMAGING PROGRAM
Publication number
20220260673
Publication date
Aug 18, 2022
NEC Corporation
Tatsuya SUMIYA
G01 - MEASURING TESTING
Information
Patent Application
SYNTHETIC APERTURE RADAR SIGNAL PROCESSING DEVICE AND SIGNAL PROCES...
Publication number
20220221577
Publication date
Jul 14, 2022
NEC Corporation
Daisuke IKEFUJI
G01 - MEASURING TESTING
Information
Patent Application
SYNTHETIC-APERTURE-RADAR IMAGE PROCESSING DEVICE AND IMAGE PROCESSI...
Publication number
20220179065
Publication date
Jun 9, 2022
NEC Corporation
Daisuke IKEFUJI
G01 - MEASURING TESTING
Information
Patent Application
RADAR SYSTEM AND IMAGING METHOD
Publication number
20220171052
Publication date
Jun 2, 2022
NEC Corporation
Kazumine OGURA
G01 - MEASURING TESTING
Information
Patent Application
SYNTHETIC-APERTURE-RADAR-SIGNAL PROCESSING DEVICE, METHOD, AND PROGRAM
Publication number
20210333389
Publication date
Oct 28, 2021
NEC Corporation
Daisuke IKEFUJI
G01 - MEASURING TESTING
Information
Patent Application
RADAR SIGNAL IMAGING DEVICE, RADAR SIGNAL IMAGING METHOD, AND RADAR...
Publication number
20210239829
Publication date
Aug 5, 2021
NEC Corporation
Kazumine OGURA
G01 - MEASURING TESTING
Information
Patent Application
SYNTHETIC APERTURE RADAR SIGNAL ANALYSIS DEVICE, SYNTHETIC APERTURE...
Publication number
20210223389
Publication date
Jul 22, 2021
NEC Corporation
Daisuke IKEFUJI
G01 - MEASURING TESTING
Information
Patent Application
SYNTHETIC APERTURE RADAR IMAGE ANALYSIS SYSTEM, SYNTHETIC APERTURE...
Publication number
20210132214
Publication date
May 6, 2021
NEC Corporation
Taichi TANAKA
G01 - MEASURING TESTING
Information
Patent Application
SYNTHETIC APERTURE RADAR SIGNAL PROCESSING DEVICE AND METHOD
Publication number
20210072376
Publication date
Mar 11, 2021
NEC Corporation
Daisuke IKEFUJI
G01 - MEASURING TESTING