Daisuke Kajiwara

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Koshi City, Kumamoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Foreign substance detection device and foreign substance detection...
- Patent number 11,906,414
- Issue date Feb 20, 2024
- Tokyo Electron Limited
- Masato Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Foreign substance detection device and foreign substance detection...
- Patent number 11,402,313
- Issue date Aug 2, 2022
- Tokyo Electron Limited
- Masato Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Foreign substance detection device, foreign substance detection met...
- Patent number 11,048,016
- Issue date Jun 29, 2021
- Tokyo Electron Limited
- Masato Hayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE INSPECTION APPARATUS, SUBSTRATE INSPECTION METHOD, AND RE...
- Publication number 20230224559
- Publication date Jul 13, 2023
- TOKYO ELECTRON LIMITED
- Daisuke Kajiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOREIGN SUBSTANCE DETECTION DEVICE AND FOREIGN SUBSTANCE DETECTION...
- Publication number 20220326133
- Publication date Oct 13, 2022
- TOKYO ELECTRON LIMITED
- Masato Hayashi
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN SUBSTANCE DETECTION DEVICE AND FOREIGN SUBSTANCE DETECTION...
- Publication number 20210190661
- Publication date Jun 24, 2021
- TOKYO ELECTRON LIMITED
- Masato Hayashi
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN SUBSTANCE DETECTION DEVICE, FOREIGN SUBSTANCE DETECTION MET...
- Publication number 20190383963
- Publication date Dec 19, 2019
- TOKYO ELECTRON LIMITED
- Masato Hayashi
- G01 - MEASURING TESTING