Daisuke KAWANO

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Miyagi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Transfer method and transfer system
- Patent number 11,380,568
- Issue date Jul 5, 2022
- Tokyo Electron Limited
- Kippei Sugita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring device and operation method of system for inspecting focu...
- Patent number 11,164,729
- Issue date Nov 2, 2021
- Tokyo Electron Limited
- Kippei Sugita
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and method for obtaining amount of deviation of me...
- Patent number 10,948,317
- Issue date Mar 16, 2021
- Tokyo Electron Limited
- Kippei Sugita
- G01 - MEASURING TESTING
Information Patent Grant
Method of obtaining amount of deviation of a measuring device, and...
- Patent number 10,903,100
- Issue date Jan 26, 2021
- Tokyo Electron Limited
- Kippei Sugita
- G01 - MEASURING TESTING
Information Patent Grant
Transfer method and transfer system
- Patent number 10,861,729
- Issue date Dec 8, 2020
- Tokyo Electron Limited
- Kippei Sugita
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TRANSFER METHOD AND TRANSFER SYSTEM
- Publication number 20210057252
- Publication date Feb 25, 2021
- TOKYO ELECTRON LIMITED
- Kippei SUGITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSFER METHOD AND TRANSFER SYSTEM
- Publication number 20200194295
- Publication date Jun 18, 2020
- TOKYO ELECTRON LIMITED
- Kippei SUGITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING DEVICE AND METHOD FOR OBTAINING AMOUNT OF DEVIATION OF ME...
- Publication number 20190277665
- Publication date Sep 12, 2019
- TOKYO ELECTRON LIMITED
- Kippei SUGITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING DEVICE AND OPERATION METHOD OF SYSTEM FOR INSPECTING FOCU...
- Publication number 20190279848
- Publication date Sep 12, 2019
- TOKYO ELECTRON LIMITED
- Kippei SUGITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OBTAINING AMOUNT OF DEVIATION OF A MEASURING DEVICE, AND...
- Publication number 20190164791
- Publication date May 30, 2019
- TOKYO ELECTRON LIMITED
- Kippei SUGITA
- H01 - BASIC ELECTRIC ELEMENTS