Daisuke Maruyama

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Computer-readable recording medium storing analysis program, analys...
- Patent number 11,693,054
- Issue date Jul 4, 2023
- Fujitsu Limited
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Circuit division method for test pattern generation and circuit div...
- Patent number 9,772,377
- Issue date Sep 26, 2017
- Fujitsu Limited
- Daisuke Maruyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test pattern generating method, device, and program
- Patent number 8,332,715
- Issue date Dec 11, 2012
- Fujitsu Limited
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generating method and apparatus and storing medium for...
- Patent number 7,437,646
- Issue date Oct 14, 2008
- Fujitsu Limited
- Daisuke Maruyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for bit pattern learning and computer product
- Patent number 7,246,292
- Issue date Jul 17, 2007
- Fujitsu Limited
- Daisuke Maruyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing apparatus and testing method for an integrated circuit, and...
- Patent number 7,178,078
- Issue date Feb 13, 2007
- Fujitsu Limited
- Takahisa Hiraide
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit testing method, program, storing medium, and app...
- Patent number 7,027,947
- Issue date Apr 11, 2006
- Fujitsu Limited
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Fault simulation method and apparatus, and storage medium storing f...
- Patent number 6,205,567
- Issue date Mar 20, 2001
- Fujitsu Limited
- Daisuke Maruyama
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COMPUTER-READABLE RECORDING MEDIUM STORING TEST PATTERN GENERATION...
- Publication number 20240019492
- Publication date Jan 18, 2024
- Fujitsu Limited
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-READABLE RECORDING MEDIUM STORING ANALYSIS PROGRAM, ANALYS...
- Publication number 20220390516
- Publication date Dec 8, 2022
- Fujitsu Limited
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT DIVISION METHOD FOR TEST PATTERN GENERATION AND CIRCUIT DIV...
- Publication number 20160154056
- Publication date Jun 2, 2016
- Fujitsu Limited
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN GENERATOR, METHOD OF GENERATING TEST PATTERN, AND COMP...
- Publication number 20130035891
- Publication date Feb 7, 2013
- Fujitsu Limited
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Test pattern generating method , device , and program
- Publication number 20100287429
- Publication date Nov 11, 2010
- FUJITSU LIMITED
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus and testing method for an integrated circuit, and...
- Publication number 20070168816
- Publication date Jul 19, 2007
- FUJITSU LIMITED
- Takahisa Hiraide
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and method for bit pattern learning and computer product
- Publication number 20060156103
- Publication date Jul 13, 2006
- FUJITSU LIMITED
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Test pattern generating method, test pattern generating apparatus a...
- Publication number 20050289425
- Publication date Dec 29, 2005
- FUJITSU LIMITED
- Daisuke Maruyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Integrated circuit testing method, program, storing medium, and app...
- Publication number 20040243339
- Publication date Dec 2, 2004
- FUJITSU LIMITED
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus and testing method for an integrated circuit, and...
- Publication number 20020124217
- Publication date Sep 5, 2002
- FUJITSU LIMITED
- Takahisa Hiraide
- G01 - MEASURING TESTING

Daisuke Maruyama

Person

Patents Grantslast 30 patents

Computer-readable recording medium storing analysis program, analys...

Circuit division method for test pattern generation and circuit div...

Test pattern generating method, device, and program

Test pattern generating method and apparatus and storing medium for...

Apparatus and method for bit pattern learning and computer product

Testing apparatus and testing method for an integrated circuit, and...

Integrated circuit testing method, program, storing medium, and app...

Fault simulation method and apparatus, and storage medium storing f...

Patents Applicationslast 30 patents

COMPUTER-READABLE RECORDING MEDIUM STORING TEST PATTERN GENERATION...

COMPUTER-READABLE RECORDING MEDIUM STORING ANALYSIS PROGRAM, ANALYS...

CIRCUIT DIVISION METHOD FOR TEST PATTERN GENERATION AND CIRCUIT DIV...

TEST PATTERN GENERATOR, METHOD OF GENERATING TEST PATTERN, AND COMP...

Test pattern generating method , device , and program

Testing apparatus and testing method for an integrated circuit, and...

Apparatus and method for bit pattern learning and computer product

Test pattern generating method, test pattern generating apparatus a...

Integrated circuit testing method, program, storing medium, and app...

Testing apparatus and testing method for an integrated circuit, and...