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Daisuke Mitsumoto
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Kyoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Three-dimensional shape measuring apparatus, three-dimensional shap...
Patent number
8,705,049
Issue date
Apr 22, 2014
Omron Corporation
Yuki Honma
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for inspecting surface state
Patent number
8,615,125
Issue date
Dec 24, 2013
Omron Corporation
Yasumoto Mori
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Shape measurement apparatus and calibration method
Patent number
8,363,929
Issue date
Jan 29, 2013
Omron Corporation
Takeshi Kojima
G01 - MEASURING TESTING
Information
Patent Grant
Shape measuring apparatus and shape measuring method
Patent number
8,334,985
Issue date
Dec 18, 2012
Omron Corporation
To Sho
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional shape measuring apparatus, three-dimensional shap...
Patent number
8,199,335
Issue date
Jun 12, 2012
Omron Corporation
Daisuke Mitsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for generating projecting pattern
Patent number
8,103,089
Issue date
Jan 24, 2012
OMRON Corporation
Masaki Suwa
G01 - MEASURING TESTING
Information
Patent Grant
Image processing apparatus, image processing method, image processi...
Patent number
8,019,120
Issue date
Sep 13, 2011
Omron Corporation
Yoshiro Murata
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for generating projecting pattern
Patent number
7,940,981
Issue date
May 10, 2011
Omron Corporation
Masaki Suwa
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional shape measuring apparatus, program, computer-read...
Patent number
7,684,052
Issue date
Mar 23, 2010
Omron Corporation
Masaki Suwa
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD
Publication number
20120086950
Publication date
Apr 12, 2012
Omron Corporation
To Sho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS AND METHOD FOR INSPECTING SURFACE STATE
Publication number
20120087566
Publication date
Apr 12, 2012
Omron Corporation
Yasumoto Mori
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
THREE-DIMENSIONAL SHAPE MEASURING APPARATUS, THREE-DIMENSIONAL SHAP...
Publication number
20120019836
Publication date
Jan 26, 2012
Omron Corporation
Yuki Honma
G01 - MEASURING TESTING
Information
Patent Application
SHAPE MEASUREMENT APPARATUS AND CALIBRATION METHOD
Publication number
20110262007
Publication date
Oct 27, 2011
OMRON CORPORATION,
Takeshi KOJIMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR GENERATING PROJECTING PATTERN
Publication number
20110096982
Publication date
Apr 28, 2011
Omron Corporation
Masaki Suwa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
THREE-DIMENSIONAL SHAPE MEASURING APPARATUS, THREE-DIMENSIONAL SHAP...
Publication number
20100195114
Publication date
Aug 5, 2010
Omron Corporation
Daisuke Mitsumoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, IMAGE PROCESSI...
Publication number
20070253596
Publication date
Nov 1, 2007
OMRON CORPORATION
Yoshiro Murata
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Three-dimensional shape measuring apparatus, program, computer-read...
Publication number
20070090189
Publication date
Apr 26, 2007
Omron Corporation
Masaki Suwa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for generating projecting pattern
Publication number
20070009150
Publication date
Jan 11, 2007
Omron Corporation
Masaki Suwa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Image processing apparatus
Publication number
20060078197
Publication date
Apr 13, 2006
Omron Corporation
Daisuke Mitsumoto
G06 - COMPUTING CALCULATING COUNTING