Daisuke Mutou

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Mobara, JP

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Patents Grantslast 30 patents

Information Patent Grant
Liquid crystal display device
- Patent number 9,568,795
- Issue date Feb 14, 2017
- Japan Display Inc.
- Takao Nakamura
- G02 - OPTICS
Information Patent Grant
Liquid crystal display device
- Patent number 9,170,463
- Issue date Oct 27, 2015
- Japan Display Inc.
- Takao Nakamura
- G02 - OPTICS
Information Patent Grant
Display device
- Patent number 8,675,163
- Issue date Mar 18, 2014
- Japan Display Inc.
- Hiroyuki Abe
- G02 - OPTICS
Information Patent Grant
Liquid crystal display device
- Patent number 8,563,982
- Issue date Oct 22, 2013
- Hitachi Displays, Ltd.
- Takao Nakamura
- G02 - OPTICS
Information Patent Grant
Liquid crystal display device having identification information
- Patent number 8,330,915
- Issue date Dec 11, 2012
- Hitachi Displays, Ltd.
- Hiroyuki Abe
- G02 - OPTICS
Information Patent Grant
Method for measuring thickness of thin film, method for forming pol...
- Patent number 7,542,152
- Issue date Jun 2, 2009
- Hitachi Displays, Ltd.
- Kazuo Takeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Liquid Crystal Display Device
- Publication number 20160011478
- Publication date Jan 14, 2016
- Japan Display Inc.
- Takao Nakamura
- G02 - OPTICS
Information Patent Application
Liquid Crystal Display Device
- Publication number 20140043555
- Publication date Feb 13, 2014
- Japan Display Inc.
- Takao Nakamura
- G02 - OPTICS
Information Patent Application
DISPLAY DEVICE
- Publication number 20130100389
- Publication date Apr 25, 2013
- Hiroyuki ABE
- G02 - OPTICS
Information Patent Application
LIQUID CRYSTAL DISPLAY DEVICE
- Publication number 20120153292
- Publication date Jun 21, 2012
- Hitachi Displays, Ltd.
- Takao NAKAMURA
- G02 - OPTICS
Information Patent Application
LIQUID CRYSTAL DISPLAY DEVICE
- Publication number 20100073616
- Publication date Mar 25, 2010
- Hitachi Displays, Ltd.
- Hiroyuki ABE
- G02 - OPTICS
Information Patent Application
Method for measuring thickness of thin film, method for forming pol...
- Publication number 20060279744
- Publication date Dec 14, 2006
- Kazuo Takeda
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing a polycrystalline semiconductor film, appa...
- Publication number 20050215077
- Publication date Sep 29, 2005
- Kazuo Takeda
- H01 - BASIC ELECTRIC ELEMENTS