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Daisuke Niwa
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Tokyo, JP
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last 30 patents
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Patent Grant
Semiconductor sensing field effect transistor, semiconductor sensin...
Patent number
7,838,912
Issue date
Nov 23, 2010
Waseda University
Daisuke Niwa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR DNA SENSING DEVICE AND DNA SENSING METHOD
Publication number
20100221841
Publication date
Sep 2, 2010
Tetsuya OSAKA
G01 - MEASURING TESTING
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Patent Application
Semiconductor Sensing Field Effect Transistor, Semiconductor Sensin...
Publication number
20080012049
Publication date
Jan 17, 2008
Daisuke Niwa
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor DNA sensing device and DNA sensing method
Publication number
20070207471
Publication date
Sep 6, 2007
Waseda University
Tetsuya Osaka
G01 - MEASURING TESTING