Daisuke Okano

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Chiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Overheat detection circuit and semiconductor device
- Patent number 9,983,067
- Issue date May 29, 2018
- ABLIC INC.
- Masakazu Sugiura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reticle for projection exposure apparatus and exposure method using...
- Patent number 7,951,512
- Issue date May 31, 2011
- Seiko Instruments Inc.
- Daisuke Okano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Photoelectric conversion device including a switch between referenc...
- Patent number 7,692,133
- Issue date Apr 6, 2010
- Seiko Instruments Inc.
- Satoshi Machida
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
OVERHEAT DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20150308902
- Publication date Oct 29, 2015
- SEIKO INSTRUMENTS INC.
- Masakazu SUGIURA
- G01 - MEASURING TESTING
Information Patent Application
RETICLE FOR PROJECTION EXPOSURE APPARATUS AND EXPOSURE METHOD USING...
- Publication number 20090225294
- Publication date Sep 10, 2009
- Daisuke Okano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Photoelectric conversion device
- Publication number 20080236645
- Publication date Oct 2, 2008
- Satoshi Machida
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Photoelectric conversion device
- Publication number 20080217519
- Publication date Sep 11, 2008
- Masahiro Yokomichi
- H03 - BASIC ELECTRONIC CIRCUITRY