Daisuke Okumura

Person

Kyoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Orthogonal acceleration time-of-flight mass spectrometer
- Patent number 11,862,451
- Issue date Jan 2, 2024
- Shimadzu Corporation
- Takuya Suzumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid sample introduction method and liquid sample introduction de...
- Patent number 11,309,173
- Issue date Apr 19, 2022
- Shimadzu Corporation
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,239,069
- Issue date Feb 1, 2022
- Shimadzu Corporation
- Kazuma Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,152,201
- Issue date Oct 19, 2021
- Shimadzu Corporation
- Tomoyuki Oshiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,152,202
- Issue date Oct 19, 2021
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power connector for mass spectrometer
- Patent number 11,081,333
- Issue date Aug 3, 2021
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration time-of-flight mass spectrometry
- Patent number 10,923,339
- Issue date Feb 16, 2021
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 10,705,048
- Issue date Jul 7, 2020
- Shimadzu Corporation
- Daisuke Okumura
- G01 - MEASURING TESTING
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 10,699,892
- Issue date Jun 30, 2020
- Shimadzu Corporation
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration time-of-flight mass spectrometry
- Patent number 10,573,504
- Issue date Feb 25, 2020
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid sample introduction system for ion source
- Patent number 10,529,548
- Issue date Jan 7, 2020
- Shimadzu Corporation
- Daisuke Okumura
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer
- Patent number 10,229,823
- Issue date Mar 12, 2019
- Shimadzu Corporation
- Masaru Nishiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 10,020,181
- Issue date Jul 10, 2018
- Shimadzu Corporation
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 9,865,444
- Issue date Jan 9, 2018
- Shimadzu Corporation
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionizer and mass spectrometer including first section for ionizing...
- Patent number 9,691,598
- Issue date Jun 27, 2017
- Shimadzu Corporation
- Kanako Sekimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide and mass spectrometer
- Patent number 9,589,781
- Issue date Mar 7, 2017
- Shimadzu Corporation
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 9,373,490
- Issue date Jun 21, 2016
- Shimadzu Corporation
- Masaru Nishiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method of driving ion guide
- Patent number 9,324,551
- Issue date Apr 26, 2016
- Shimadzu Corporation
- Junichi Taniguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrograph apparatus and method of driving ion guide
- Patent number 9,230,788
- Issue date Jan 5, 2016
- Shimadzu Corporation
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric pressure ionization mass spectrometer
- Patent number 9,040,902
- Issue date May 26, 2015
- Shimadzu Corporation
- Manabu Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,866,077
- Issue date Oct 21, 2014
- Shimadzu Corporation
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tandem mass spectrometer and mass spectrometric method
- Patent number 8,866,074
- Issue date Oct 21, 2014
- Shimadzu Corporation
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric pressure ionization mass spectrometer
- Patent number 8,822,915
- Issue date Sep 2, 2014
- Shimadzu Corporation
- Kazuo Mukaibatake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MS/MS mass spectrometer
- Patent number 8,748,811
- Issue date Jun 10, 2014
- Shimadzu Corporation
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Triple quadrupole mass spectrometer
- Patent number 8,698,072
- Issue date Apr 15, 2014
- Shimadzu Corporation
- Hiroshi Sugawara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MS/MS mass spectrometer
- Patent number 8,698,074
- Issue date Apr 15, 2014
- Shimadzu Corporation
- Hiroto Itoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric pressure ionization mass spectrometer
- Patent number 8,637,810
- Issue date Jan 28, 2014
- Shimadzu Corporation
- Kazuo Mukaibatake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,563,920
- Issue date Oct 22, 2013
- Shimadzu Corporation
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MS/MS mass spectrometer
- Patent number 8,384,028
- Issue date Feb 26, 2013
- Shimadzu Corporation
- Shinjiro Fujita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MS/MS mass spectrometer
- Patent number 8,269,166
- Issue date Sep 18, 2012
- Shimadzu Corporation
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
- Publication number 20230253197
- Publication date Aug 10, 2023
- SHIMADZU CORPORATION
- Yoshiharu YAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20230022148
- Publication date Jan 26, 2023
- Shimadzu Corporation
- Takuya SUZUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID SAMPLE INTRODUCTION METHOD AND LIQUID SAMPLE INTRODUCTION DE...
- Publication number 20220199385
- Publication date Jun 23, 2022
- Shimadzu Corporation
- Daisuke OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID SAMPLE INTRODUCTION METHOD AND LIQUID SAMPLE INTRODUCTION DE...
- Publication number 20220199386
- Publication date Jun 23, 2022
- Shimadzu Corporation
- Daisuke OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID SAMPLE INTRODUCTION METHOD AND LIQUID SAMPLE INTRODUCTION DE...
- Publication number 20210313163
- Publication date Oct 7, 2021
- SHIMADZU CORPORATION
- Daisuke OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20210249250
- Publication date Aug 12, 2021
- SHIMADZU CORPORATION
- Kazuma MAEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20210125819
- Publication date Apr 29, 2021
- SHIMADZU CORPORATION
- Tomoya KUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20210013019
- Publication date Jan 14, 2021
- SHIMADZU CORPORATION
- Tomoyuki OSHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY
- Publication number 20200152441
- Publication date May 14, 2020
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20200075305
- Publication date Mar 5, 2020
- Shimadzu Corporation
- Tomoya KUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20190162697
- Publication date May 30, 2019
- SHIMADZU CORPORATION
- Daisuke OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY
- Publication number 20190019664
- Publication date Jan 17, 2019
- SHIMADZU CORPORATION
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID SAMPLE INTRODUCTION SYSTEM FOR ION SOURCE AND ANALYSIS DEVICE
- Publication number 20190013189
- Publication date Jan 10, 2019
- SHIMADZU CORPORATION
- Daisuke OKUMURA
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER
- Publication number 20180315588
- Publication date Nov 1, 2018
- SHIMADZU CORPORATION
- Masaru NISHIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20170278691
- Publication date Sep 28, 2017
- SHIMADZU CORPORATION
- Daisuke OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20170271140
- Publication date Sep 21, 2017
- SHIMADZU CORPORATION
- Daisuke OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20170236701
- Publication date Aug 17, 2017
- SHIMADZU CORPORATION
- Daisuke OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZER AND MASS SPECTROMETER
- Publication number 20160163527
- Publication date Jun 9, 2016
- SHIMADZU CORPORATION
- Kanako SEKIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROGRAPH APPARATUS AND METHOD OF DRIVING ION GUIDE
- Publication number 20150041642
- Publication date Feb 12, 2015
- SHIMADZU CORPORATION
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD OF DRIVING ION GUIDE
- Publication number 20140361163
- Publication date Dec 11, 2014
- Shimadzu Corporation
- Junichi TANIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATMOSPHERIC PRESSURE IONIZATION MASS SPECTROMETER
- Publication number 20140284473
- Publication date Sep 25, 2014
- SHIMADZU CORPORATION
- Manabu Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20140252217
- Publication date Sep 11, 2014
- SHIMADZU CORPORATION
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TANDEM MASS SPECTROMETER AND MASS SPECTROMETRIC METHOD
- Publication number 20140239170
- Publication date Aug 28, 2014
- Shimadzu Corporation
- Daisuke OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATMOSPHERIC PRESSURE IONIZATION MASS SPECTROMETER
- Publication number 20140103206
- Publication date Apr 17, 2014
- Kazuo Mukaibatake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRIPLE QUADRUPOLE MASS SPECTROMETER
- Publication number 20130334415
- Publication date Dec 19, 2013
- Shimadzu Corporation
- Hiroshi Sugawara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE AND MASS SPECTROMETER
- Publication number 20130284918
- Publication date Oct 31, 2013
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE BAND GAP PHOTOVOLTAIC DEVICE AND PROCESS OF MANUFACTURE
- Publication number 20130255775
- Publication date Oct 3, 2013
- Kuniaki Shida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MS/MS Mass Spectrometer
- Publication number 20130214146
- Publication date Aug 22, 2013
- Shimadzu Corporation
- Daisuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Atmospheric Pressure Ionization Mass Spectrometer
- Publication number 20130092835
- Publication date Apr 18, 2013
- SHIMADZU CORPORATION
- Kazuo Mukaibatake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MS/MS MASS SPECTROMETER
- Publication number 20120205536
- Publication date Aug 16, 2012
- Shimadzu Corporation
- Hiroto Itoi
- H01 - BASIC ELECTRIC ELEMENTS

Daisuke Okumura

Person

Patents Grantslast 30 patents

Orthogonal acceleration time-of-flight mass spectrometer

Liquid sample introduction method and liquid sample introduction de...

Mass spectrometer

Time-of-flight mass spectrometer

Time-of-flight mass spectrometer

Power connector for mass spectrometer

Orthogonal acceleration time-of-flight mass spectrometry

Mass spectrometer

Time-of-flight mass spectrometer

Orthogonal acceleration time-of-flight mass spectrometry

Liquid sample introduction system for ion source

Mass spectrometer

Time-of-flight mass spectrometer

Time-of-flight mass spectrometer

Ionizer and mass spectrometer including first section for ionizing...

Ion guide and mass spectrometer

Time-of-flight mass spectrometer

Mass spectrometer and method of driving ion guide

Mass spectrograph apparatus and method of driving ion guide

Atmospheric pressure ionization mass spectrometer

Mass spectrometer

Tandem mass spectrometer and mass spectrometric method

Atmospheric pressure ionization mass spectrometer

MS/MS mass spectrometer

Triple quadrupole mass spectrometer

MS/MS mass spectrometer

Atmospheric pressure ionization mass spectrometer

Mass spectrometer

MS/MS mass spectrometer

MS/MS mass spectrometer

Patents Applicationslast 30 patents

MASS SPECTROMETRY METHOD AND MASS SPECTROMETER

ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER

LIQUID SAMPLE INTRODUCTION METHOD AND LIQUID SAMPLE INTRODUCTION DE...

LIQUID SAMPLE INTRODUCTION METHOD AND LIQUID SAMPLE INTRODUCTION DE...

LIQUID SAMPLE INTRODUCTION METHOD AND LIQUID SAMPLE INTRODUCTION DE...

MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETER

ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY

MASS SPECTROMETER

MASS SPECTROMETER

ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY

LIQUID SAMPLE INTRODUCTION SYSTEM FOR ION SOURCE AND ANALYSIS DEVICE

MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETER

IONIZER AND MASS SPECTROMETER

MASS SPECTROGRAPH APPARATUS AND METHOD OF DRIVING ION GUIDE

MASS SPECTROMETER AND METHOD OF DRIVING ION GUIDE

ATMOSPHERIC PRESSURE IONIZATION MASS SPECTROMETER

MASS SPECTROMETER

TANDEM MASS SPECTROMETER AND MASS SPECTROMETRIC METHOD

ATMOSPHERIC PRESSURE IONIZATION MASS SPECTROMETER

TRIPLE QUADRUPOLE MASS SPECTROMETER

ION GUIDE AND MASS SPECTROMETER

WIDE BAND GAP PHOTOVOLTAIC DEVICE AND PROCESS OF MANUFACTURE

MS/MS Mass Spectrometer

Atmospheric Pressure Ionization Mass Spectrometer

MS/MS MASS SPECTROMETER