Daisuke SAKAI

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Patents Grantslast 30 patents

Information Patent Grant
Gas cluster ion beam apparatus and analyzing apparatus
- Patent number 11,145,484
- Issue date Oct 12, 2021
- ULVAC-PHI, Inc.
- Mauo Sogou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source, ion gun, and analysis instrument
- Patent number 9,372,161
- Issue date Jun 21, 2016
- ULVAC-PHI, INC.
- Daisuke Sakai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GAS CLUSTER ION BEAM APPARATUS AND ANALYZING APPARATUS
- Publication number 20200312604
- Publication date Oct 1, 2020
- ULVAC-PHI, INC.
- Mauo SOGOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE, ION GUN, AND ANALYSIS INSTRUMENT
- Publication number 20150206732
- Publication date Jul 23, 2015
- ULVAC-PHI, INC.
- Daisuke SAKAI
- G01 - MEASURING TESTING
Information Patent Application
ANALYTICAL METHOD
- Publication number 20110064198
- Publication date Mar 17, 2011
- ULVAC, Inc.
- Toshijyu KUNIBE
- G01 - MEASURING TESTING