Daisuke TAKANO

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sensor test apparatus
- Patent number 11,693,049
- Issue date Jul 4, 2023
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Sensor test apparatus
- Patent number 11,614,350
- Issue date Mar 28, 2023
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Sensor test system
- Patent number 11,460,520
- Issue date Oct 4, 2022
- ADV ANTEST Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device handling apparatus and electronic device testing...
- Patent number 9,588,142
- Issue date Mar 7, 2017
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR TEST SYSTEM
- Publication number 20200191886
- Publication date Jun 18, 2020
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Application
SENSOR TEST APPARATUS
- Publication number 20200191622
- Publication date Jun 18, 2020
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Application
SENSOR TEST APPARATUS
- Publication number 20200191864
- Publication date Jun 18, 2020
- Advantest Corporation
- Kazunari Suga
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
ELECTRONIC DEVICE HANDLING APPARATUS AND ELECTRONIC DEVICE TESTING...
- Publication number 20160116503
- Publication date Apr 28, 2016
- Advantest Corporation
- Toshiyuki KIYOKAWA
- G01 - MEASURING TESTING
Information Patent Application
ADAPTER AND INTERFACE AND ELECTRONIC DEVICE TEST APPARATUS PROVIDED...
- Publication number 20090027060
- Publication date Jan 29, 2009
- Advantest Corporation
- Daisuke Takano
- G01 - MEASURING TESTING