Dale A. Heaton

Person

Lucas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for testing a device
- Patent number 7,437,262
- Issue date Oct 14, 2008
- Texas Instruments Incorporated
- William C. Boose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for multisite RF transceiver testing
- Patent number 7,340,219
- Issue date Mar 4, 2008
- Texas Instruments Incorporated
- Dale A. Heaton
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for generating and measuring noise parameters
- Patent number 7,177,772
- Issue date Feb 13, 2007
- Texas Instruments Incorporated
- Henry P. Largey
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High resolution current measurement method
- Patent number 6,720,788
- Issue date Apr 13, 2004
- Texas Instruments Incorporated
- David D. Colby
- G01 - MEASURING TESTING
Information Patent Grant
Low power, bipolar, wide bandwidth unity gain buffer
- Patent number 6,052,028
- Issue date Apr 18, 2000
- Texas Instruments Incorporated
- Dale A. Heaton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Differential clamp for amplifier circuits
- Patent number 5,973,561
- Issue date Oct 26, 1999
- Texas Instruments Incorporated
- Dale A. Heaton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Impedance matching network for low output impedance devices
- Patent number 5,463,359
- Issue date Oct 31, 1995
- Texas Instruments Incorporated
- Dale A. Heaton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Relayless interconnections in high performance signal paths
- Patent number 5,103,169
- Issue date Apr 7, 1992
- Texas Instruments Incorporated
- Dale A. Heaton
- G01 - MEASURING TESTING
Information Patent Grant
Biasing circuits for field effect transistors using GaAs FETS
- Patent number 5,065,043
- Issue date Nov 12, 1991
- Texas Instruments Incorporated
- James E. Bartling
- G05 - CONTROLLING REGULATING
Information Patent Grant
Parametric measurement unit/device power supply for semiconductor t...
- Patent number 5,059,889
- Issue date Oct 22, 1991
- Texas Instruments Incorporated
- Dale A. Heaton
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
System and method for generating and measuring noise parameters
- Publication number 20050267716
- Publication date Dec 1, 2005
- TEXAS INSTRUMENTS INCORPORATED
- Henry P. Largey
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and system for multisite RF transceiver testing
- Publication number 20050186914
- Publication date Aug 25, 2005
- TEXAS INSTRUMENTS INCORPORATED
- Dale A. Heaton
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System and method for testing a device
- Publication number 20050044445
- Publication date Feb 24, 2005
- TEXAS INSTRUMENTS INCORPORATED
- William C. Boose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH RESOLUTION CURRENT MEASUREMENT METHOD
- Publication number 20040021478
- Publication date Feb 5, 2004
- David D. Colby
- G01 - MEASURING TESTING
Information Patent Application
Coherent clock measurement unit
- Publication number 20030210029
- Publication date Nov 13, 2003
- Billy Antheunisse
- G01 - MEASURING TESTING

Dale A. Heaton

Person

Patents Grantslast 30 patents

System and method for testing a device

Method and system for multisite RF transceiver testing

System and method for generating and measuring noise parameters

High resolution current measurement method

Low power, bipolar, wide bandwidth unity gain buffer

Differential clamp for amplifier circuits

Impedance matching network for low output impedance devices

Relayless interconnections in high performance signal paths

Biasing circuits for field effect transistors using GaAs FETS

Parametric measurement unit/device power supply for semiconductor t...

Patents Applicationslast 30 patents

System and method for generating and measuring noise parameters

Method and system for multisite RF transceiver testing

System and method for testing a device

HIGH RESOLUTION CURRENT MEASUREMENT METHOD

Coherent clock measurement unit