Dale E. Hoffman

Person

Fishkill, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Performing sub-system attribute modification
- Patent number 9,740,981
- Issue date Aug 22, 2017
- International Business Machines Corporation
- Karl O. Casserly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performing sub-system attribute modification
- Patent number 9,740,980
- Issue date Aug 22, 2017
- International Business Machines Corporation
- Karl O. Casserly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for evaluating decoupling capacitor placement for VLSI chips
- Patent number 6,618,844
- Issue date Sep 9, 2003
- International Business Machines Corporation
- Allan H. Dansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for evaluating decoupling capacitor placement for VLSI chips
- Patent number 6,618,843
- Issue date Sep 9, 2003
- International Business Machines Corporation
- Allan H. Dansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for evaluating decoupling capacitor placement for VLSI chips
- Patent number 6,323,050
- Issue date Nov 27, 2001
- International Business Machines Corporation
- Allan H. Dansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Per pin circuit test system having N-bit pin interface providing sp...
- Patent number 5,381,421
- Issue date Jan 10, 1995
- International Business Machines Corporation
- John E. Dickol
- G01 - MEASURING TESTING
Information Patent Grant
Per-pin integrated circuit test system having n-bit interface
- Patent number 5,127,011
- Issue date Jun 30, 1992
- International Business Machines Corporation
- Michael L. Combs
- G01 - MEASURING TESTING
Information Patent Grant
Driver circuit for testing bi-directional transceiver semiconductor...
- Patent number 5,097,144
- Issue date Mar 17, 1992
- International Business Machines Corporation
- Albert Y. Chang
- G01 - MEASURING TESTING
Information Patent Grant
Programmable delay line utilizing measured actual delays to provide...
- Patent number 5,013,944
- Issue date May 7, 1991
- International Business Machines Corporation
- Jeffrey H. Fischer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
High speed digital counter
- Patent number 4,924,484
- Issue date May 8, 1990
- International Business Machines Corp.
- Lawrence J. Grasso
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for reducing and maintaining constant overshoot in a high...
- Patent number 4,779,270
- Issue date Oct 18, 1988
- International Business Machines Corporation
- Algirdas J. Gruodis
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
PERFORMING SUB-SYSTEM ATTRIBUTE MODIFICATION
- Publication number 20150149483
- Publication date May 28, 2015
- International Business Machines Corporation
- Karl O. Casserly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PERFORMING SUB-SYSTEM ATTRIBUTE MODIFICATION
- Publication number 20150149485
- Publication date May 28, 2015
- International Business Machines Corporation
- Karl O. Casserly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for evaluating decoupling capacitor placement for VLSI chips
- Publication number 20020040463
- Publication date Apr 4, 2002
- International Business Machines Corporation
- Allan H. Dansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for evaluating decoupling capacitor placement for VLSI chips
- Publication number 20020040467
- Publication date Apr 4, 2002
- INTERNATION BUSINESS MACHINES CORPORATION
- Allan H. Dansky
- G06 - COMPUTING CALCULATING COUNTING

Dale E. Hoffman

Person

Patents Grantslast 30 patents

Performing sub-system attribute modification

Performing sub-system attribute modification

Method for evaluating decoupling capacitor placement for VLSI chips

Method for evaluating decoupling capacitor placement for VLSI chips

Method for evaluating decoupling capacitor placement for VLSI chips

Per pin circuit test system having N-bit pin interface providing sp...

Per-pin integrated circuit test system having n-bit interface

Driver circuit for testing bi-directional transceiver semiconductor...

Programmable delay line utilizing measured actual delays to provide...

High speed digital counter

Apparatus for reducing and maintaining constant overshoot in a high...

Patents Applicationslast 30 patents

PERFORMING SUB-SYSTEM ATTRIBUTE MODIFICATION

PERFORMING SUB-SYSTEM ATTRIBUTE MODIFICATION

Method for evaluating decoupling capacitor placement for VLSI chips

Method for evaluating decoupling capacitor placement for VLSI chips