Dale E. Ibbotson

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Bridgewater, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Plasma etch end point detection process
- Patent number 5,877,407
- Issue date Mar 2, 1999
- Lucent Technologies Inc.
- Gardy Cadet
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Active neural network determination of endpoint in a plasma etch pr...
- Patent number 5,653,894
- Issue date Aug 5, 1997
- Lucent Technologies Inc.
- Dale Edward Ibbotson
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for real time monitoring of wafer attributes i...
- Patent number 5,654,903
- Issue date Aug 5, 1997
- Lucent Technologies Inc.
- Edward A. Reitman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Process for fabricating a device using an ellipsometric technique
- Patent number 5,494,697
- Issue date Feb 27, 1996
- AT&T Corp.
- Nadine Blayo
- G01 - MEASURING TESTING