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Dale G. Fried
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Dover, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and apparatus for three-dimensional (3D) imaging
Patent number
11,112,503
Issue date
Sep 7, 2021
Massachusetts Institute of Technology
Dale G. Fried
G01 - MEASURING TESTING
Information
Patent Grant
System and method for wide-area surveillance
Patent number
10,823,825
Issue date
Nov 3, 2020
3DEO, INC
Dale G. Fried
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for phased array imaging
Patent number
10,571,569
Issue date
Feb 25, 2020
Massachusetts Institute of Technology
Juan C. Montoya
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for phased array imaging
Patent number
10,073,177
Issue date
Sep 11, 2018
Massachusetts Institute of Technology
Juan C. Montoya
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for three-dimensional (3D) imaging
Patent number
9,915,733
Issue date
Mar 13, 2018
Massachusetts Institute of Technology
Dale G. Fried
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR AN AIRBORNE MAPPING LIDAR
Publication number
20220404505
Publication date
Dec 22, 2022
3DEO, INC.
BRANDON R. CALL
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR PHASED ARRAY IMAGING
Publication number
20190064357
Publication date
Feb 28, 2019
Juan C. Montoya
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR WIDE-AREA SURVEILLANCE
Publication number
20180275252
Publication date
Sep 27, 2018
3DEO, INC.
DALE G. FRIED
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Methods and Apparatus for Three-Dimensional (3D) Imaging
Publication number
20180164440
Publication date
Jun 14, 2018
Massachusetts Institute of Technology
Dale G. FRIED
G01 - MEASURING TESTING
Information
Patent Application
Methods and Apparatus for Three-Dimensional (3D) Imaging
Publication number
20160356890
Publication date
Dec 8, 2016
Dale G. Fried
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR PHASED ARRAY IMAGING
Publication number
20160139266
Publication date
May 19, 2016
Juan C. Montoya
G01 - MEASURING TESTING