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Dale Meehl
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Melbourne, FL, US
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last 30 patents
Information
Patent Grant
Securing access to integrated circuit scan mode and data
Patent number
10,222,417
Issue date
Mar 5, 2019
Cadence Design Systems, Inc.
Akhil Garg
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and system for improving efficiency of sequential test compr...
Patent number
9,817,068
Issue date
Nov 14, 2017
Cadence Design Systems, Inc.
Vivek Chickermane
G01 - MEASURING TESTING
Information
Patent Grant
Reducing mask data volume with elastic compression
Patent number
9,702,934
Issue date
Jul 11, 2017
Cadence Design Systems, Inc.
Dale Edward Meehl
G01 - MEASURING TESTING
Information
Patent Grant
Elastic compression-optimizing tester bandwidth with compressed tes...
Patent number
9,470,754
Issue date
Oct 18, 2016
Cadence Design Systems, Inc.
Vivek Chickermane
G01 - MEASURING TESTING
Information
Patent Grant
System and method for bit-wise selective masking of scan vectors fo...
Patent number
9,448,282
Issue date
Sep 20, 2016
Cadence Design Systems, Inc.
Dale Edward Meehl
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for low-pin count testing of integrated circuits
Patent number
8,904,256
Issue date
Dec 2, 2014
Cadence Design Systems, Inc.
Krishna Chakravadhanula
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for low-pin count testing of integrated circuits
Patent number
8,650,524
Issue date
Feb 11, 2014
Cadence Design Systems, Inc.
Krishna Chakravadhanula
G06 - COMPUTING CALCULATING COUNTING