Dale Ohmart

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Sugar Land, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Die attach pick error detection
- Patent number 10,388,609
- Issue date Aug 20, 2019
- Texas Instruments Incorporated
- Dale Ohmart
- G01 - MEASURING TESTING
Information Patent Grant
Test systems and methods of testing devices
- Patent number 9,880,195
- Issue date Jan 30, 2018
- Texas Instruments Incorporated
- Dale Vincent Ohmart
- G01 - MEASURING TESTING
Information Patent Grant
Die attach pick error detection
- Patent number 9,229,058
- Issue date Jan 5, 2016
- Texas Instruments Incorporated
- Dale Ohmart
- G01 - MEASURING TESTING
Information Patent Grant
Method for final testing of semiconductor devices
- Patent number 5,589,765
- Issue date Dec 31, 1996
- Texas Instruments Incorporated
- Dale V. Ohmart
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST SYSTEMS AND METHODS OF TESTING DEVICES
- Publication number 20170108533
- Publication date Apr 20, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Dale Vincent Ohmart
- G01 - MEASURING TESTING
Information Patent Application
WAFER WITH DIE MAP
- Publication number 20160141251
- Publication date May 19, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Dale Ohmart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Die Attach Pick Error Detection
- Publication number 20140002128
- Publication date Jan 2, 2014
- Dale Ohmart
- G01 - MEASURING TESTING