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Damian HOFFMAN
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Tzur Yitzhak, IL
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Patents Grants
last 30 patents
Information
Patent Grant
System and methods for three dimensional modeling of an object usin...
Patent number
11,860,262
Issue date
Jan 2, 2024
VAYYAR IMAGING LTD.
Raviv Melamed
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for providing wide beam radar arrays
Patent number
11,852,744
Issue date
Dec 26, 2023
Naftali Chayat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System, device and methods for localization and orientation of a ra...
Patent number
11,709,255
Issue date
Jul 25, 2023
VAYYAR IMAGING LTD.
Yuval Lomnitz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems, devices and methods of transmission line calibration for a...
Patent number
11,662,429
Issue date
May 30, 2023
VAYYAR IMAGING LTD.
Damian Hoffman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for shaping beams produced by antenna arrays
Patent number
11,630,184
Issue date
Apr 18, 2023
Mark Popov
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for providing wide beam radar arrays
Patent number
11,474,200
Issue date
Oct 18, 2022
Naftali Chayat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and methods for three dimensional modeling of an object usin...
Patent number
11,092,684
Issue date
Aug 17, 2021
VAYYAR IMAGING LTD.
Raviv Melamed
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System, device and methods for imaging of objects using electromagn...
Patent number
11,067,685
Issue date
Jul 20, 2021
VAYYAR IMAGING LTD.
Yuval Lomnitz
G01 - MEASURING TESTING
Information
Patent Grant
System, device and methods for localization and orientation of a ra...
Patent number
11,041,949
Issue date
Jun 22, 2021
VAYYAR IMAGING LTD.
Yuval Lomnitz
G01 - MEASURING TESTING
Information
Patent Grant
System and methods for calibrating an antenna array using targets
Patent number
11,016,173
Issue date
May 25, 2021
VAYYAR IMAGING LTD.
Damian Hoffman
G01 - MEASURING TESTING
Information
Patent Grant
System and method for radio frequency penetration imaging of an object
Patent number
10,854,990
Issue date
Dec 1, 2020
VAYYAR IMAGING LTD.
Damian Hoffman
G01 - MEASURING TESTING
Information
Patent Grant
System, device and methods for imaging of objects using electromagn...
Patent number
10,809,372
Issue date
Oct 20, 2020
VAYYAR IMAGING LTD.
Yuval Lomnitz
G01 - MEASURING TESTING
Information
Patent Grant
System and methods for three dimensional modeling of an object usin...
Patent number
10,690,760
Issue date
Jun 23, 2020
VAYYAR IMAGING LTD.
Raviv Melamed
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
System and method for radio frequency penetration imaging of an object
Patent number
10,566,699
Issue date
Feb 18, 2020
VAYYAR IMAGING LTD.
Damian Hoffman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for radio frequency penetration imaging of an object
Patent number
10,290,948
Issue date
May 14, 2019
VAYYAR IMAGING LTD.
Damian Hoffman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System, device and methods for localization and orientation of a ra...
Patent number
10,288,728
Issue date
May 14, 2019
VAYYAR IMAGING LTD.
Yuval Lomnitz
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHODS FOR THREE DIMENSIONAL MODELING OF AN OBJECT USIN...
Publication number
20240103149
Publication date
Mar 28, 2024
Vayyar Imaging Ltd.
Raviv MELAMED
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR PROVIDING WIDE BEAM RADAR ARRAYS
Publication number
20240085522
Publication date
Mar 14, 2024
Vayyar Imaging Ltd.
NAFTALI CHAYAT
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR SHAPING BEAMS PRODUCED BY ANTENNA ARRAYS
Publication number
20230251347
Publication date
Aug 10, 2023
Vayyar Imaging Ltd.
MARK POPOV
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR PROVIDING WIDE BEAM RADAR ARRAYS
Publication number
20220206141
Publication date
Jun 30, 2022
Vayyar Imaging Ltd.
NAFTALI CHAYAT
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR SHAPING BEAMS PRODUCED BY ANTENNA ARRAYS
Publication number
20220206107
Publication date
Jun 30, 2022
Vayyar Imaging Ltd.
MARK POPOV
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR PROVIDING WIDE BEAM RADAR ARRAYS
Publication number
20220107387
Publication date
Apr 7, 2022
Vayyar Imaging Ltd.
NAFTALI CHAYAT
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHODS FOR THREE DIMENSIONAL MODELING OF AN OBJECT USIN...
Publication number
20210373140
Publication date
Dec 2, 2021
Vayyar Imaging Ltd.
Raviv MELAMED
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM, DEVICE AND METHODS FOR LOCALIZATION AND ORIENTATION OF A RA...
Publication number
20210286070
Publication date
Sep 16, 2021
Vayyar Imaging Ltd.
Yuval LOMNITZ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS, DEVICES AND METHODS OF TRANSMISSION LINE CALIBRATION FOR A...
Publication number
20210190909
Publication date
Jun 24, 2021
Vayyar Imaging Ltd.
Damian Hoffman
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR RADIO FREQUENCY PENETRATION IMAGING OF AN OBJECT
Publication number
20210066812
Publication date
Mar 4, 2021
Vayyar Imaging Ltd.
Damian HOFFMAN
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, DEVICE AND METHODS FOR IMAGING OF OBJECTS USING ELECTROMAGN...
Publication number
20210003696
Publication date
Jan 7, 2021
Vayyar Imaging Ltd.
Yuval LOMNITZ
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHODS FOR THREE DIMENSIONAL MODELING OF AN OBJECT USIN...
Publication number
20200271771
Publication date
Aug 27, 2020
Vayyar Imaging Ltd.
Raviv MELAMED
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR RADIO FREQUENCY PENETRATION IMAGING OF AN OBJECT
Publication number
20200161772
Publication date
May 21, 2020
Vayyar Imaging Ltd.
Damian HOFFMAN
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR RADIO FREQUENCY PENETRATION IMAGING OF AN OBJECT
Publication number
20190260134
Publication date
Aug 22, 2019
Vayyar Imaging Ltd.
Damian HOFFMAN
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, DEVICE AND METHODS FOR LOCALIZATION AND ORIENTATION OF A RA...
Publication number
20190227161
Publication date
Jul 25, 2019
Vayyar Imaging Ltd.
Yuval LOMNITZ
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHODS FOR CALIBRATING AN ANTENNA ARRAY USING TARGETS
Publication number
20190025403
Publication date
Jan 24, 2019
Vayyar Imaging Ltd.
Damian HOFFMAN
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEM, DEVICE AND METHODS FOR IMAGING OF OBJECTS USING ELECTROMAGN...
Publication number
20180299543
Publication date
Oct 18, 2018
Vayyar Imaging Ltd.
Yuval LOMNITZ
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHODS FOR THREE DIMENSIONAL MODELING OF AN OBJECT USIN...
Publication number
20180143311
Publication date
May 24, 2018
Vayyar Imaging Ltd.
Raviv MELAMED
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, DEVICE AND METHODS FOR LOCALIZATION AND ORIENTATION OF A RA...
Publication number
20180128915
Publication date
May 10, 2018
Vayyar Imaging Ltd.
Yuval LOMNITZ
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR RADIO FREQUENCY PENETRATION IMAGING OF AN OBJECT
Publication number
20170033469
Publication date
Feb 2, 2017
Vayyar Imaging Ltd.
Damian HOFFMAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR MEASURUNG AN OBJECT LOCATION AND/OR ORIENTATI...
Publication number
20160356877
Publication date
Dec 8, 2016
Vayyar Imaging Ltd.
Raviv MELAMED
G01 - MEASURING TESTING