Damian Kucharczyk

Person

Glowna, PL

People

Patents Grantslast 30 patents

Information Patent Grant
Protection device for an area detector
- Patent number 11,085,889
- Issue date Aug 10, 2021
- Rigaku Corporation
- Damian Kucharczyk
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector and technique of controlling the X-ray detector
- Patent number 10,684,378
- Issue date Jun 16, 2020
- Rigaku Corporation
- Damian Kucharczyk
- G01 - MEASURING TESTING
Information Patent Grant
X-ray optical device
- Patent number 10,629,319
- Issue date Apr 21, 2020
- Rigaku Corporation
- Damian Kucharczyk
- G01 - MEASURING TESTING
Information Patent Grant
In-situ crystalline material screening apparatus and method
- Patent number 8,182,607
- Issue date May 22, 2012
- Agilent Technologies, Inc.
- Damian Kucharczyk
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction apparatus
- Patent number 7,158,608
- Issue date Jan 2, 2007
- Oxford Diffraction Limited
- Damian Kucharczyk
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Frame for a fiber optic taper
- Patent number 6,913,398
- Issue date Jul 5, 2005
- Oxford Diffraction LTD
- Damian Kucharczyk
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
PROTECTION DEVICE FOR AN AREA DETECTOR
- Publication number 20200096458
- Publication date Mar 26, 2020
- Rigaku Corporation
- Damian Kucharczyk
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR AND TECHNIQUE OF CONTROLLING THE X-RAY DETECTOR
- Publication number 20190011579
- Publication date Jan 10, 2019
- Rigaku Corporation
- Damian Kucharczyk
- G01 - MEASURING TESTING
Information Patent Application
X-RAY OPTICAL DEVICE
- Publication number 20180240563
- Publication date Aug 23, 2018
- Rigaku Corporation
- Damian Kucharczyk
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ELECTRONIC VARIABLE GAIN FOR X-RAY DETECTOR
- Publication number 20140034842
- Publication date Feb 6, 2014
- Damian Kucharczyk
- G01 - MEASURING TESTING
Information Patent Application
GRADIENT VACUUM FOR HIGH-FLUX X-RAY SOURCE
- Publication number 20140029729
- Publication date Jan 30, 2014
- Damian Kucharczyk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TENSIONED FLAT ELECTRON EMITTER TAPE
- Publication number 20140029730
- Publication date Jan 30, 2014
- Damian Kucharczyk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU CRYSTALLINE MATERIAL SCREENING APPARATUS AND METHOD
- Publication number 20070140421
- Publication date Jun 21, 2007
- OXFORD DIFFRACTION LIMITED
- Damian Kucharczyk
- C30 - CRYSTAL GROWTH
Information Patent Application
High flux X-ray source
- Publication number 20040228445
- Publication date Nov 18, 2004
- OXFORD DIFFRACTION LTD.
- Damian Kucharczyk
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-ray diffraction apparatus
- Publication number 20040028180
- Publication date Feb 12, 2004
- OXFORD DIFFRACTION LTD.
- Damian Kucharczyk
- G01 - MEASURING TESTING
Information Patent Application
Frame for a fibre optic taper
- Publication number 20040028347
- Publication date Feb 12, 2004
- OXFORD DIFFRACTION LTD.
- Damian Kucharczyk
- G02 - OPTICS

Damian Kucharczyk

Person

Patents Grantslast 30 patents

Protection device for an area detector

X-ray detector and technique of controlling the X-ray detector

X-ray optical device

In-situ crystalline material screening apparatus and method

X-ray diffraction apparatus

Frame for a fiber optic taper

Patents Applicationslast 30 patents

PROTECTION DEVICE FOR AN AREA DETECTOR

X-RAY DETECTOR AND TECHNIQUE OF CONTROLLING THE X-RAY DETECTOR

X-RAY OPTICAL DEVICE

ELECTRONIC VARIABLE GAIN FOR X-RAY DETECTOR

GRADIENT VACUUM FOR HIGH-FLUX X-RAY SOURCE

TENSIONED FLAT ELECTRON EMITTER TAPE

IN-SITU CRYSTALLINE MATERIAL SCREENING APPARATUS AND METHOD

High flux X-ray source

X-ray diffraction apparatus

Frame for a fibre optic taper