Damon Heer

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for ex situ analysis of a substrate
- Patent number 8,884,247
- Issue date Nov 11, 2014
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Ex Situ Analysis of a Substrate
- Publication number 20140084157
- Publication date Mar 27, 2014
- FEI Company
- Thomas G. Miller
- G01 - MEASURING TESTING