Dan A. Pankowsky

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Nashville, TN, US

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Patents Grantslast 30 patents

Information Patent Grant
Products and methods for single parameter and multiparameter phenot...
- Patent number 7,537,907
- Issue date May 26, 2009
- Dan A. Pankowsky
- G01 - MEASURING TESTING
Information Patent Grant
Products and methods for single parameter and multiparameter phenot...
- Patent number 7,364,906
- Issue date Apr 29, 2008
- Dan A. Pankowsky
- G01 - MEASURING TESTING
Information Patent Grant
Products and methods for single parameter and multiparameter phenot...
- Patent number 7,351,589
- Issue date Apr 1, 2008
- Dan A. Pankowsky
- G01 - MEASURING TESTING
Information Patent Grant
Products and methods for single parameter and multiparameter phenot...
- Patent number 6,828,157
- Issue date Dec 7, 2004
- Dan A. Pankowsky
- G01 - MEASURING TESTING
Information Patent Grant
Products and methods for single parameter and multiparameter phenot...
- Patent number 6,682,940
- Issue date Jan 27, 2004
- Dan A. Pankowsky
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PRODUCTS AND METHODS FOR SINGLE PARAMETER AND MULTIPARAMETER PHENOT...
- Publication number 20080131917
- Publication date Jun 5, 2008
- Dan A. Pankowsky
- G01 - MEASURING TESTING
Information Patent Application
Products and methods for single parameter and multiparameter phenot...
- Publication number 20050090022
- Publication date Apr 28, 2005
- Dan A. Pankowsky
- G01 - MEASURING TESTING
Information Patent Application
Products and methods for single parameter and multiparameter phenot...
- Publication number 20040132116
- Publication date Jul 8, 2004
- Dan A. Pankowsky
- G01 - MEASURING TESTING
Information Patent Application
Products and methods for single parameter and multiparameter phenot...
- Publication number 20010041343
- Publication date Nov 15, 2001
- Dan A. Pankowsky
- G01 - MEASURING TESTING