Dan Engelhard

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Adaptive correlation of pattern resist structures using optical met...
- Patent number 7,440,881
- Issue date Oct 21, 2008
- Timbre Technologies, Inc.
- Daniel Edward Engelhard
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Optical metrology model optimization for process control
- Patent number 7,395,132
- Issue date Jul 1, 2008
- Timbre Technologies, Inc.
- Daniel Prager
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology model optimization for process control
- Patent number 7,221,989
- Issue date May 22, 2007
- Tokyo Electron Limited
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology model optimization for process control
- Patent number 7,065,423
- Issue date Jun 20, 2006
- Timbre Technologies, Inc.
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive correlation of pattern resist structures using optical met...
- Patent number 6,791,679
- Issue date Sep 14, 2004
- Timbre Technologies, Inc.
- Daniel Edward Engelhard
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
Optical metrology model optimization for process control
- Publication number 20070225851
- Publication date Sep 27, 2007
- Timbre Technologies, Inc.
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Application
Optical metrology model optimization for process control
- Publication number 20060247816
- Publication date Nov 2, 2006
- TOKYO ELECTRON LIMITED
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Application
Optical metrology model optimization for process control
- Publication number 20060009872
- Publication date Jan 12, 2006
- Timbre Technologies, Inc.
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Application
Adaptive correlation of pattern resist structures using optical met...
- Publication number 20050007577
- Publication date Jan 13, 2005
- Timbre Technologies, Inc.
- Daniel Edward Engelhard
- G05 - CONTROLLING REGULATING
Information Patent Application
Adaptive correlation of pattern resist structures using optical met...
- Publication number 20040152221
- Publication date Aug 5, 2004
- Daniel Edward Engelhard
- G05 - CONTROLLING REGULATING