Dan Grossman

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Herzelia, IL

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Patents Grantslast 30 patents

Information Patent Grant
High resolution wafer inspection system
- Patent number 7,973,919
- Issue date Jul 5, 2011
- Applied Materials Israel, Ltd.
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Grant
High resolution wafer inspection system
- Patent number 7,714,999
- Issue date May 11, 2010
- Applied Materials Israel, Ltd.
- Dan Grossman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH RESOLUTION WAFER INSPECTION SYSTEM
- Publication number 20100188658
- Publication date Jul 29, 2010
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION WAFER INSPECTION SYSTEM
- Publication number 20080231845
- Publication date Sep 25, 2008
- Dan Grossman
- G01 - MEASURING TESTING