Dan Kapp

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Determining a configuration for an optical element positioned in a...
- Patent number 10,215,713
- Issue date Feb 26, 2019
- KLA-Tencor Corp.
- Pavel Kolchin
- G01 - MEASURING TESTING
Information Patent Grant
Defect marking for semiconductor wafer inspection
- Patent number 10,082,470
- Issue date Sep 25, 2018
- KLA-Tencor Corporation
- David Shortt
- G01 - MEASURING TESTING
Information Patent Grant
Determining a configuration for an optical element positioned in a...
- Patent number 9,709,510
- Issue date Jul 18, 2017
- KLA-Tencor Corp.
- Pavel Kolchin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Defect Marking For Semiconductor Wafer Inspection
- Publication number 20180088056
- Publication date Mar 29, 2018
- KLA-Tencor Corporation
- David Shortt
- G01 - MEASURING TESTING
Information Patent Application
Determining a Configuration for an Optical Element Positioned in a...
- Publication number 20170292918
- Publication date Oct 12, 2017
- KLA-Tencor Corporation
- Pavel Kolchin
- G01 - MEASURING TESTING
Information Patent Application
Determining a Configuration for an Optical Element Positioned in a...
- Publication number 20150377797
- Publication date Dec 31, 2015
- KLA-Tencor Corporation
- Pavel Kolchin
- G01 - MEASURING TESTING