Dan Mironescu

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Yoqneam Elite, IL

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Patents Grantslast 30 patents

Information Patent Grant
Probes for a wafer test apparatus
- Patent number 7,808,260
- Issue date Oct 5, 2010
- Kulicke and Soffa Industries, Inc.
- Lich Thanh Tran
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probes for a Wafer Test Apparatus
- Publication number 20080258746
- Publication date Oct 23, 2008
- Lich Thanh Tran
- G01 - MEASURING TESTING
Information Patent Application
Spring loaded probe pin assembly
- Publication number 20080204061
- Publication date Aug 28, 2008
- Dov Chartarifsky
- G01 - MEASURING TESTING