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Dan Ohev Zion
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Ra'anana, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Radar apparatus, system, and method
Patent number
12,066,517
Issue date
Aug 20, 2024
Intel Corporation
Naftali Landsberg
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Multi-static radar system for automobile radar sensing
Patent number
11,747,457
Issue date
Sep 5, 2023
Intel Corporation
Yaron Kahana
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, system and method of leakage cancellation for multiple i...
Patent number
11,372,081
Issue date
Jun 28, 2022
Intel Corporation
Mark A. Lehne
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, system and method of synchronization between Global Navi...
Patent number
11,099,277
Issue date
Aug 24, 2021
Intel Corporation
Dan Ohev Zion
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MULTI-STATIC RADAR SYSTEM FOR AUTOMOBILE RADAR SENSING
Publication number
20230324534
Publication date
Oct 12, 2023
Intel Corporation
Yaron Kahana
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, SYSTEM AND METHOD OF DETECTING INTERFERENCE IN A RADAR R...
Publication number
20220334216
Publication date
Oct 20, 2022
Intel Corporation
Lior Maor
G01 - MEASURING TESTING
Information
Patent Application
RADAR APPARATUS, SYSTEM, AND METHOD
Publication number
20210364619
Publication date
Nov 25, 2021
Intel Corporation
Naftali Landsberg
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, SYSTEM AND METHOD OF SYNCHRONIZATION BETWEEN GLOBAL NAVI...
Publication number
20200158888
Publication date
May 21, 2020
Intel IP Corporation
Dan Ohev Zion
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, SYSTEM AND METHOD OF LEAKAGE CANCELLATION FOR MULTIPLE I...
Publication number
20200132805
Publication date
Apr 30, 2020
Mark A. Lehne
G01 - MEASURING TESTING
Information
Patent Application
MULTI-STATIC RADAR SYSTEM FOR AUTOMOBILE RADAR SENSING
Publication number
20190339373
Publication date
Nov 7, 2019
Intel Corporation
Yaron Kahana
G01 - MEASURING TESTING