Dan Trock

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Katzrin, IL

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Patents Grantslast 30 patents

Information Patent Grant
Input/output voltage testing with boundary scan bypass
- Patent number 11,567,130
- Issue date Jan 31, 2023
- Amazon Technologies, Inc.
- Dan Trock
- G01 - MEASURING TESTING
Information Patent Grant
Scan channel fabric for tiled circuit designs
- Patent number 10,990,739
- Issue date Apr 27, 2021
- Amazon Technologies, Inc.
- Dan Trock
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Yield-oriented design-for-test in power-switchable cores
- Patent number 10,955,472
- Issue date Mar 23, 2021
- Amazon Technologies, Inc.
- Dan Trock
- G01 - MEASURING TESTING
Information Patent Grant
Bistable-element for random number generation
- Patent number 10,187,044
- Issue date Jan 22, 2019
- Amazon Technologies, Inc.
- Ron Diamant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self test controller for a random number generator core
- Patent number 9,983,262
- Issue date May 29, 2018
- Amazon Technologies, Inc.
- Dan Trock
- G01 - MEASURING TESTING
Information Patent Grant
Bistable-element for random number generation
- Patent number 9,774,317
- Issue date Sep 26, 2017
- Amazon Technologies, Inc.
- Ron Diamant
- H03 - BASIC ELECTRONIC CIRCUITRY