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Dana M. Combs
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Maumee, OH, US
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last 30 patents
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Patent Grant
Method and apparatus for measuring, analyzing, and characterizing i...
Patent number
7,013,716
Issue date
Mar 21, 2006
Dana Corporation
Mark Shuster
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for measuring irregularities on an outer surfa...
Patent number
6,816,250
Issue date
Nov 9, 2004
Dana Corporation
Mark Shuster
G01 - MEASURING TESTING