Daniel A. Flores-Ibarra

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Rochester, MN, US

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Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR TESTING AN IC USING A PLURALITY OF I/O LINES
- Publication number 20080059107
- Publication date Mar 6, 2008
- IBM
- Wayne A. Britson
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing an IC
- Publication number 20050149783
- Publication date Jul 7, 2005
- International Business Machines Corporation
- Wayne A. Britson
- G01 - MEASURING TESTING