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Daniel Bivolaru
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Hampton, VA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Evanescent field coupled shock wave detection systems and methods
Patent number
11,841,266
Issue date
Dec 12, 2023
General Electric Company
Daniel Bivolaru
G01 - MEASURING TESTING
Information
Patent Grant
Evanescent field coupled shock wave detection systems and methods
Patent number
11,519,779
Issue date
Dec 6, 2022
Innoveering, LLC
Daniel Bivolaru
G01 - MEASURING TESTING
Information
Patent Grant
Plasma-based electro-optical sensing and methods
Patent number
11,469,082
Issue date
Oct 11, 2022
Innoveering, LLC
George Papadopoulos
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma-based electro-optical sensing and methods
Patent number
11,153,960
Issue date
Oct 19, 2021
Innoveering, LLC
George Papadopoulos
G01 - MEASURING TESTING
Information
Patent Grant
Microwave adapting plasma torch module
Patent number
9,681,529
Issue date
Jun 13, 2017
The United States of America as represented by the Secretary of the Air Force
Spencer Kuo
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Spatially-and temporally-resolved multi-parameter interferometric r...
Patent number
8,976,351
Issue date
Mar 10, 2015
The United States of America as Represented by NASA
Daniel Bivolaru
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric Rayleigh scattering measurement system
Patent number
7,414,708
Issue date
Aug 19, 2008
The United States of America as represented by the administrator of the Natio...
Daniel Bivolaru
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SHOCK WAVE DETECTION SYSTEMS AND METHODS
Publication number
20240247975
Publication date
Jul 25, 2024
GENERAL ELECTRIC COMPANY
Daniel BIVOLARU
G01 - MEASURING TESTING
Information
Patent Application
EVANESCENT FIELD COUPLED SHOCK WAVE DETECTION SYSTEMS AND METHODS
Publication number
20220390273
Publication date
Dec 8, 2022
Innoveering, LLC
Daniel Bivolaru
G01 - MEASURING TESTING
Information
Patent Application
SPATIALLY-AND TEMPORALLY-RESOLVED MULTI-PARAMETER INTERFEROMETRIC R...
Publication number
20130141721
Publication date
Jun 6, 2013
U.S.A. as represented by the Administrator of the National Aeronautics and Sp...
Daniel Bivolaru
G01 - MEASURING TESTING
Information
Patent Application
Interferometric Rayleigh Scattering Measurement System
Publication number
20080043219
Publication date
Feb 21, 2008
United States of America - the Administrator of the National Aeronautics and...
Daniel Bivolaru
G01 - MEASURING TESTING