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Daniel Bosák
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Mikuluvka, CZ
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last 30 patents
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Patent Grant
Specimen preparation and inspection in a dual-beam charged particle...
Patent number
10,629,409
Issue date
Apr 21, 2020
FEI Company
Frantisek Vaske
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SPECIMEN PREPARATION AND INSPECTION IN A DUAL-BEAM CHARGED PARTICLE...
Publication number
20190108971
Publication date
Apr 11, 2019
FEI Company
Frantisek Vaske
H01 - BASIC ELECTRIC ELEMENTS