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Daniel C. Weaver
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Newbury Park, CA, US
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last 30 patents
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Patent Grant
Detecting a deposition condition
Patent number
8,546,205
Issue date
Oct 1, 2013
Skyworks Solutions, Inc.
Lam T. Luu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Methods of evaporating metal onto a semiconductor wafer in a test w...
Patent number
8,481,344
Issue date
Jul 9, 2013
Skyworks Solutions, Inc.
Lam T. Luu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Apparatus and methods for detecting evaporation conditions
Patent number
8,030,725
Issue date
Oct 4, 2011
Skyworks Solutions, Inc.
Lam T. Luu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Apparatus and methods for evaporation including test wafer holder
Patent number
8,022,448
Issue date
Sep 20, 2011
Skyworks Solutions, Inc.
Lam T. Luu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Patents Applications
last 30 patents
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Patent Application
DETECTING A DEPOSITION CONDITION
Publication number
20120083050
Publication date
Apr 5, 2012
SKYWORKS SOLUTIONS, INC.
Lam T. Luu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
METHODS OF EVAPORATING METAL ONTO A SEMICONDUCTOR WAFER IN A TEST W...
Publication number
20120083118
Publication date
Apr 5, 2012
SKYWORKS SOLUTIONS, INC.
Lam T. Luu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...