TREA

Daniel D. Siems

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  • Boerne, TX, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Wafer edge sealing
    • Patent number 5,618,380
    • Issue date Apr 8, 1997
    • VLSI Technology, Inc.
    • Daniel D. Siems
    • C30 - CRYSTAL GROWTH
  • Information Patent Grant

    Semiconductor wafer defect monitoring
    • Patent number 5,392,113
    • Issue date Feb 21, 1995
    • VLSI Technology, Inc.
    • Anthony Sayka
    • G01 - MEASURING TESTING