Daniel Doyle

Person

Eagle, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatuses and methods for single level cell caching
- Patent number 10,846,008
- Issue date Nov 24, 2020
- Micron Technology, Inc.
- Daniel Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for single level cell caching
- Patent number 10,372,369
- Issue date Aug 6, 2019
- Micron Technology, Inc.
- Daniel Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for single level cell caching
- Patent number 10,353,615
- Issue date Jul 16, 2019
- Micron Technology, Inc.
- Daniel Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for single level cell caching
- Patent number 10,048,887
- Issue date Aug 14, 2018
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
Structures and methods for reducing junction leakage in semiconduct...
- Patent number 8,633,513
- Issue date Jan 21, 2014
- Aptina Imaging Corporation
- Daniel Doyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
NAND architecture memory with voltage sensing
- Patent number 8,570,807
- Issue date Oct 29, 2013
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods of making a semiconductor memory device
- Patent number 8,446,762
- Issue date May 21, 2013
- Micron Technology, Inc.
- Sanh D. Tang
- G11 - INFORMATION STORAGE
Information Patent Grant
NAND architecture memory with voltage sensing
- Patent number 8,295,088
- Issue date Oct 23, 2012
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
Interleaved memory program and verify method, device and system
- Patent number 8,194,454
- Issue date Jun 5, 2012
- Round Rock Research, LLC
- Daniel H. Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device bit line sensing system and method that compensates f...
- Patent number 8,102,723
- Issue date Jan 24, 2012
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
Interleaved memory program and verify method, device and system
- Patent number 8,004,897
- Issue date Aug 23, 2011
- Round Rock Research, LLC
- Daniel H. Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods of making a semiconductor memory device
- Patent number 7,944,743
- Issue date May 17, 2011
- Micron Technology, Inc.
- Sanh D. Tang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device bit line sensing system and method that compensates f...
- Patent number 7,855,922
- Issue date Dec 21, 2010
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
Interleaved memory program and verify method, device and system
- Patent number 7,808,824
- Issue date Oct 5, 2010
- Micron Technology, Inc.
- Daniel H. Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device bit line sensing system and method that compensates f...
- Patent number 7,596,035
- Issue date Sep 29, 2009
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
Detection of row-to-row shorts and other row decode defects in memo...
- Patent number 7,593,272
- Issue date Sep 22, 2009
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
One-transistor memory cell with bias gate
- Patent number 7,589,995
- Issue date Sep 15, 2009
- Micron Technology, Inc.
- Sanh D. Tang
- G11 - INFORMATION STORAGE
Information Patent Grant
NAND architecture memory with voltage sensing
- Patent number 7,561,472
- Issue date Jul 14, 2009
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
Interleaved memory program and verify method, device and system
- Patent number 7,539,062
- Issue date May 26, 2009
- Micron Technology, Inc.
- Daniel H. Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
High density semiconductor memory
- Patent number 7,501,676
- Issue date Mar 10, 2009
- Micron Technology, Inc.
- Daniel H. Doyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flash memory device with improved erase operation
- Patent number 7,499,325
- Issue date Mar 3, 2009
- Intel Corporation
- Daniel H. Doyle
- G11 - INFORMATION STORAGE
Information Patent Grant
Detection of row-to-row shorts and other row decode defects in memo...
- Patent number 7,307,896
- Issue date Dec 11, 2007
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
APPARATUSES AND METHODS FOR SINGLE LEVEL CELL CACHING
- Publication number 20190317685
- Publication date Oct 17, 2019
- Micron Technology, Inc.
- Daniel Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR SINGLE LEVEL CELL CACHING
- Publication number 20180349055
- Publication date Dec 6, 2018
- Micron Technology, Inc.
- Daniel Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR SINGLE LEVEL CELL CACHING
- Publication number 20180349056
- Publication date Dec 6, 2018
- Micron Technology, Inc.
- Daniel Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR SINGLE LEVEL CELL CACHING
- Publication number 20180121128
- Publication date May 3, 2018
- Micron Technology, Inc.
- Daniel Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NAND ARCHITECTURE MEMORY WITH VOLTAGE SENSING
- Publication number 20130003458
- Publication date Jan 3, 2013
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Application
INTERLEAVED MEMORY PROGRAM AND VERIFY METHOD, DEVICE AND SYSTEM
- Publication number 20120002474
- Publication date Jan 5, 2012
- ROUND ROCK RESEARCH, LLC
- Daniel H. Doyle
- G11 - INFORMATION STORAGE
Information Patent Application
Methods of Making a Semiconductor Memory Device
- Publication number 20110171802
- Publication date Jul 14, 2011
- Micron Technology, Inc.
- Sanh D. Tang
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE BIT LINE SENSING SYSTEM AND METHOD THAT COMPENSATES F...
- Publication number 20110075492
- Publication date Mar 31, 2011
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Application
INTERLEAVED MEMORY PROGRAM AND VERIFY METHOD, DEVICE AND SYSTEM
- Publication number 20100322003
- Publication date Dec 23, 2010
- Micron Technology, Inc.
- Daniel H. Doyle
- G11 - INFORMATION STORAGE
Information Patent Application
STRUCTURES AND METHODS FOR REDUCING JUNCTION LEAKAGE IN SEMICONDUCT...
- Publication number 20100127356
- Publication date May 27, 2010
- Daniel Doyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE BIT LINE SENSING SYSTEM AND METHOD THAT COMPENSATES F...
- Publication number 20100020621
- Publication date Jan 28, 2010
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Application
One Transistor Memory Cell with Bias Gate
- Publication number 20090311845
- Publication date Dec 17, 2009
- Micron Technology, Inc.
- Sanh D. Tang
- G11 - INFORMATION STORAGE
Information Patent Application
NAND ARCHITECTURE MEMORY WITH VOLTAGE SENSING
- Publication number 20090273980
- Publication date Nov 5, 2009
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Application
INTERLEAVED MEMORY PROGRAM AND VERIFY METHOD, DEVICE AND SYSTEM
- Publication number 20090231918
- Publication date Sep 17, 2009
- Micron Technology, Inc.
- Daniel H. Doyle
- G11 - INFORMATION STORAGE
Information Patent Application
Memory device bit line sensing system and method that compensates f...
- Publication number 20090003087
- Publication date Jan 1, 2009
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Application
FLASH MEMORY DEVICE WITH IMPROVED ERASE OPERATION
- Publication number 20080151646
- Publication date Jun 26, 2008
- Daniel H. Doyle
- G11 - INFORMATION STORAGE
Information Patent Application
Interleaved memory program and verify method, device and system
- Publication number 20080151637
- Publication date Jun 26, 2008
- Micron Technology, Inc.
- Daniel H. Doyle
- G11 - INFORMATION STORAGE
Information Patent Application
Detection of row-to-row shorts and other row decode defects in memo...
- Publication number 20080074934
- Publication date Mar 27, 2008
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Application
One-transistor memory cell with bias gate
- Publication number 20080061346
- Publication date Mar 13, 2008
- Micron Technology, Inc.
- Sanh D. Tang
- G11 - INFORMATION STORAGE
Information Patent Application
NAND architecture memory with voltage sensing
- Publication number 20080062762
- Publication date Mar 13, 2008
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE
Information Patent Application
High density semiconductor memory and method of making
- Publication number 20070063242
- Publication date Mar 22, 2007
- Daniel H. Doyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High density semiconductor memory and method of making
- Publication number 20060214209
- Publication date Sep 28, 2006
- Daniel H. Doyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detection of row-to-row shorts and other row decode defects in memo...
- Publication number 20060203599
- Publication date Sep 14, 2006
- Micron Technology, Inc.
- Daniel Doyle
- G11 - INFORMATION STORAGE

Daniel Doyle

Person

Patents Grantslast 30 patents

Apparatuses and methods for single level cell caching

Apparatuses and methods for single level cell caching

Apparatuses and methods for single level cell caching

Apparatuses and methods for single level cell caching

Structures and methods for reducing junction leakage in semiconduct...

NAND architecture memory with voltage sensing

Methods of making a semiconductor memory device

NAND architecture memory with voltage sensing

Interleaved memory program and verify method, device and system

Memory device bit line sensing system and method that compensates f...

Interleaved memory program and verify method, device and system

Methods of making a semiconductor memory device

Memory device bit line sensing system and method that compensates f...

Interleaved memory program and verify method, device and system

Memory device bit line sensing system and method that compensates f...

Detection of row-to-row shorts and other row decode defects in memo...

One-transistor memory cell with bias gate

NAND architecture memory with voltage sensing

Interleaved memory program and verify method, device and system

High density semiconductor memory

Flash memory device with improved erase operation

Detection of row-to-row shorts and other row decode defects in memo...

Patents Applicationslast 30 patents

APPARATUSES AND METHODS FOR SINGLE LEVEL CELL CACHING

APPARATUSES AND METHODS FOR SINGLE LEVEL CELL CACHING

APPARATUSES AND METHODS FOR SINGLE LEVEL CELL CACHING

APPARATUSES AND METHODS FOR SINGLE LEVEL CELL CACHING

NAND ARCHITECTURE MEMORY WITH VOLTAGE SENSING

INTERLEAVED MEMORY PROGRAM AND VERIFY METHOD, DEVICE AND SYSTEM

Methods of Making a Semiconductor Memory Device

MEMORY DEVICE BIT LINE SENSING SYSTEM AND METHOD THAT COMPENSATES F...

INTERLEAVED MEMORY PROGRAM AND VERIFY METHOD, DEVICE AND SYSTEM

STRUCTURES AND METHODS FOR REDUCING JUNCTION LEAKAGE IN SEMICONDUCT...

MEMORY DEVICE BIT LINE SENSING SYSTEM AND METHOD THAT COMPENSATES F...

One Transistor Memory Cell with Bias Gate

NAND ARCHITECTURE MEMORY WITH VOLTAGE SENSING

INTERLEAVED MEMORY PROGRAM AND VERIFY METHOD, DEVICE AND SYSTEM

Memory device bit line sensing system and method that compensates f...

FLASH MEMORY DEVICE WITH IMPROVED ERASE OPERATION

Interleaved memory program and verify method, device and system

Detection of row-to-row shorts and other row decode defects in memo...

One-transistor memory cell with bias gate

NAND architecture memory with voltage sensing

High density semiconductor memory and method of making

High density semiconductor memory and method of making

Detection of row-to-row shorts and other row decode defects in memo...