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Daniel E. Klimek
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Lexington, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Beam combination using interleaved optical plates
Patent number
7,965,910
Issue date
Jun 21, 2011
Textron Systems Corporation
Daniel E. Klimek
G02 - OPTICS
Information
Patent Grant
Beam combination using interleaved optical plates
Patent number
7,444,044
Issue date
Oct 28, 2008
Textron Systems Corporation
Daniel E. Klimek
G02 - OPTICS
Information
Patent Grant
Zig-zag laser with improved liquid cooling
Patent number
7,433,376
Issue date
Oct 7, 2008
Textron Systems Corporation
Alexander E. Mandl
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Amplified spontaneous emission ducts
Patent number
7,317,741
Issue date
Jan 8, 2008
Textron Systems Corporation
Daniel E. Klimek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Staggered array coupler
Patent number
7,116,690
Issue date
Oct 3, 2006
Textron Systems Corporation
Daniel E. Klimek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Beam combination using interleaved optical plates
Patent number
7,088,883
Issue date
Aug 8, 2006
Textron Systems Corporation
Daniel E. Klimek
G02 - OPTICS
Information
Patent Grant
Apparatus and method for remote ultrasonic determination of thin ma...
Patent number
6,393,384
Issue date
May 21, 2002
Textron Systems Corporation
Brian W. Anthony
G01 - MEASURING TESTING
Information
Patent Grant
Match filter apparatus and method for remote ultrasonic determinati...
Patent number
6,198,538
Issue date
Mar 6, 2001
Textron Systems Corporation
Daniel E. Klimek
G01 - MEASURING TESTING
Information
Patent Grant
Laser ultrasonics-based material analysis system and method utilizi...
Patent number
5,798,835
Issue date
Aug 25, 1998
Textron Systems Corporation
Petros Amestis Kotidis
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic-based material analysis using an annular impulse beam
Patent number
5,793,489
Issue date
Aug 11, 1998
Textron System Corporation
Petros Amestis Kotidis
G01 - MEASURING TESTING
Information
Patent Grant
Laser ultrasonics-based material analysis system and method
Patent number
5,781,304
Issue date
Jul 14, 1998
Textron Systems Corporation
Petros Amestis Kotidis
G01 - MEASURING TESTING
Information
Patent Grant
Laser ultrasonics-based material analysis system and method
Patent number
5,638,396
Issue date
Jun 10, 1997
Textron Systems Corporation
Daniel E. Klimek
G01 - MEASURING TESTING
Information
Patent Grant
Laser ultrasonics-based material analysis system and method using m...
Patent number
5,604,592
Issue date
Feb 18, 1997
Textron Defense Systems, Division of Avco Corporation
Petros A. Kotidis
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
BEAM COMBINATION USING INTERLEAVED OPTICAL PLATES
Publication number
20090034084
Publication date
Feb 5, 2009
Textron Systems Corporation
Daniel E. Klimek
G02 - OPTICS
Information
Patent Application
BEAM COMBINATION USING INTERLEAVED OPTICAL PLATES
Publication number
20060263004
Publication date
Nov 23, 2006
Textron Systems Corporation
Daniel E. Klimek
G02 - OPTICS
Information
Patent Application
Amplified spontaneous emission ducts
Publication number
20060045152
Publication date
Mar 2, 2006
Daniel E. Klimek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Staggered array coupler
Publication number
20050254539
Publication date
Nov 17, 2005
Daniel E. Klimek
G02 - OPTICS
Information
Patent Application
Beam combination using interleaved optical plates
Publication number
20050069260
Publication date
Mar 31, 2005
Daniel E. Klimek
G02 - OPTICS
Information
Patent Application
Semiconductor zigzag laser and optical amplifier
Publication number
20030012246
Publication date
Jan 16, 2003
Daniel E. Klimek
H01 - BASIC ELECTRIC ELEMENTS