TREA

Daniel E. Partin

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  • Hillsboro, OR, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Defect analyzer
    • Patent number 8,249,828
    • Issue date Aug 21, 2012
    • FEI Company
    • Janet Teshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Defect analyzer
    • Patent number 7,987,072
    • Issue date Jul 26, 2011
    • FEI Company
    • Janet Teshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Defect analyzer
    • Patent number 7,474,986
    • Issue date Jan 6, 2009
    • FEI Company
    • Janet Teshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Defect analyzer
    • Patent number 7,103,505
    • Issue date Sep 5, 2006
    • FEI Company
    • Janet Teshima
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    DEFECT ANALYZER
    • Publication number 20110251713
    • Publication date Oct 13, 2011
    • FEI Company
    • Janet Teshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    DEFECT ANALYZER
    • Publication number 20090230303
    • Publication date Sep 17, 2009
    • FEI Company
    • Janet Teshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Defect analyzer
    • Publication number 20070067131
    • Publication date Mar 22, 2007
    • FEI Company
    • Janet Teshima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Defect analyzer
    • Publication number 20040158409
    • Publication date Aug 12, 2004
    • Janet Teshima
    • H01 - BASIC ELECTRIC ELEMENTS