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Daniel F. Perey
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Yoktown, VA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Adsorbate analysis using optically stimulated electron emission
Patent number
12,209,980
Issue date
Jan 28, 2025
ANALYTICAL MECHANICS ASSOCIATES, INC.
William T. Yost
G01 - MEASURING TESTING
Information
Patent Grant
Method for the evaluation of adhesive bond strength via swept-frequ...
Patent number
11,519,881
Issue date
Dec 6, 2022
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
Harold A. Haldren
G01 - MEASURING TESTING
Information
Patent Grant
Methods for measuring phase dynamics and other properties
Patent number
11,185,232
Issue date
Nov 30, 2021
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
William T. Yost
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Systems and methods for measuring phase dynamics and other properties
Patent number
10,390,704
Issue date
Aug 27, 2019
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
William T. Yost
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Optically stimulated electron emission measurement device and metho...
Patent number
10,302,556
Issue date
May 28, 2019
The United States of America as represented by the Administrator of NASA
William T. Yost
G01 - MEASURING TESTING
Information
Patent Grant
Method to control crimping processes using ultrasonic transmission...
Patent number
10,153,606
Issue date
Dec 11, 2018
The United States of America as represented by the Administrator of NASA
Karl Elliott Cramer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process for nondestructive evaluation of the quality of a crimped w...
Patent number
9,537,277
Issue date
Jan 3, 2017
William T. Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ultrasonic device for assessing the quality of a wire crimp
Patent number
9,003,645
Issue date
Apr 14, 2015
The United States of America as represented by the administrator of the Natio...
William T. Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus to detect wire pathologies near crimped connector
Patent number
8,875,580
Issue date
Nov 4, 2014
The United States of America as represented by the Adminstrator of the Nation...
William T. Yost
G01 - MEASURING TESTING
Information
Patent Grant
Process for nondestructive evaluation of the quality of a crimped w...
Patent number
8,671,551
Issue date
Mar 18, 2014
The United States of America as represented by the administrator of the Natio...
William T. Yost
G01 - MEASURING TESTING
Information
Patent Grant
Assessment and calibration of a crimp tool equipped with ultrasonic...
Patent number
8,490,463
Issue date
Jul 23, 2013
The United States of America as represented by the administrator of the Natio...
William T. Yost
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for connections made between a crimp connector an...
Patent number
7,181,942
Issue date
Feb 27, 2007
The United States of America as represented by the administrator of the Natio...
William T. Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Marking electrical wiring with condition indicators
Patent number
6,985,083
Issue date
Jan 10, 2006
The United States of America as represented by the administrator of the Natio...
William T. Yost
G01 - MEASURING TESTING
Information
Patent Grant
Optically stimulated electron emission contamination monitor and me...
Patent number
6,856,403
Issue date
Feb 15, 2005
The United States of America as represented by the administrator of the Natio...
Christopher S. Welch
G01 - MEASURING TESTING
Information
Patent Grant
Method for anticipating problems with electrical wiring
Patent number
6,838,995
Issue date
Jan 4, 2005
The United States of America as represented by the administrator of the Natio...
William T. Yost
G01 - MEASURING TESTING
Information
Patent Grant
System for multiplexing acoustic emission (AE) instrumentation
Patent number
6,628,567
Issue date
Sep 30, 2003
The United States of America as represented by the administrator of the Natio...
William H. Prosser
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Registration Method for Digital Radiography of Thin Flexible Multil...
Publication number
20240274901
Publication date
Aug 15, 2024
United States of America as represented by the Administrator of NASA
Joshua L. Brown
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for the Evaluation of Adhesive Bond Strength Via Swept-Frequ...
Publication number
20210302380
Publication date
Sep 30, 2021
UNITED STATES OF AMERICAS AS REPRESENTED BY THE ADMINISTRATOR OF NASA
Harold A. Haldren
G01 - MEASURING TESTING
Information
Patent Application
Methods for Measuring Phase Dynamics and Other Properties
Publication number
20200000339
Publication date
Jan 2, 2020
United States of America as represented by the Administrator of NASA
William T. Yost
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
ADSORBATE ANALYSIS USING OPTICALLY STIMULATED ELECTRON EMISSION
Publication number
20190339216
Publication date
Nov 7, 2019
United States of America as represented by the Administrator of NASA
William T. Yost
G01 - MEASURING TESTING
Information
Patent Application
Optically Stimulated Electron Emission Measurement Device and Metho...
Publication number
20170067819
Publication date
Mar 9, 2017
U.S.A., AS REPRESENTED BY THE ADMINISTRATOR OF THE National Aeronautics and S...
WILLIAM T. YOST
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MEASURING PHASE DYNAMICS AND OTHER PROPERTIES
Publication number
20160262621
Publication date
Sep 15, 2016
U.S.A. as represented by the Administrator of the National Aeronautics and Sp...
William T. Yost
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Method and Apparatus to Control Crimping Processes Using Ultrasonic...
Publication number
20160104994
Publication date
Apr 14, 2016
USA as represented by the Administrator of the National Aeronautics and Space...
Karl Elliott Cramer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Process for Nondestructive Evaluation of the Quality of a Crimped W...
Publication number
20140173887
Publication date
Jun 26, 2014
Tyco Electronics Corporation
William T. Yost
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus to Detect Wire Pathologies Near Crimped Connector
Publication number
20130145849
Publication date
Jun 13, 2013
USA as represented by the Administrator of the National Aeronautics and Space...
William T. Yost
G01 - MEASURING TESTING
Information
Patent Application
Process and Apparatus for Nondestructive Evaluation of the Quality...
Publication number
20120192407
Publication date
Aug 2, 2012
USA as represented by the Administrator of the National Aeronautics and Space...
William T. Yost
G01 - MEASURING TESTING
Information
Patent Application
Assessment and Calibration of a Crimp Tool Equipped with Ultrasonic...
Publication number
20120060585
Publication date
Mar 15, 2012
Space Administration
William T. Yost
G01 - MEASURING TESTING
Information
Patent Application
Device and method for connections made between a crimp connector an...
Publication number
20050193792
Publication date
Sep 8, 2005
USA as represented by the Administrator of the National Aeronautics and Space...
William T. Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Marking electrical wiring with condition indicators
Publication number
20030201901
Publication date
Oct 30, 2003
Administrator of the National Aeronautics and Space Administration
William T. Yost
G01 - MEASURING TESTING
Information
Patent Application
Method for anticipating problems with electrical wiring
Publication number
20030200786
Publication date
Oct 30, 2003
U.S.A. as represented by the Administrator of the National Aeronautics and Sp...
William T. Yost
G01 - MEASURING TESTING