Daniel G. Knierim

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test and measurement instrument accessory with reconfigurable proce...
- Patent number 11,815,548
- Issue date Nov 14, 2023
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Grant
Precision, high bandwidth, switching attenuator
- Patent number 11,808,786
- Issue date Nov 7, 2023
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Analog signal isolator
- Patent number 11,768,161
- Issue date Sep 26, 2023
- Tektronix, Inc.
- Jonathan S. Dandy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Discrete offset dithered waveform averaging for high-fidelity digit...
- Patent number 11,652,494
- Issue date May 16, 2023
- Lawrence Livermore National Security, LLC
- Brandon Walter Buckley
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test and measurement devices, systems and methods associated with a...
- Patent number 11,650,225
- Issue date May 16, 2023
- Tektronix, Inc.
- Tyler B. Niles
- G01 - MEASURING TESTING
Information Patent Grant
Frequency converter accessory for a test and measurement instrument
- Patent number 11,619,657
- Issue date Apr 4, 2023
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of magnetic field sensor for current probe
- Patent number 11,619,697
- Issue date Apr 4, 2023
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Event activity trigger
- Patent number 11,552,620
- Issue date Jan 10, 2023
- Tektronix, Inc.
- Patrick A. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 11,454,651
- Issue date Sep 27, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for synchronizing multiple test and measurement...
- Patent number 11,372,025
- Issue date Jun 28, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 11,249,111
- Issue date Feb 15, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement devices, systems, and methods associated with...
- Patent number 11,187,720
- Issue date Nov 30, 2021
- Tektronix, Inc.
- Tyler B. Niles
- G01 - MEASURING TESTING
Information Patent Grant
Digital signal processing waveform synthesis for fixed sample rate...
- Patent number 11,146,280
- Issue date Oct 12, 2021
- Tektronix, Inc.
- Gregory A. Martin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Calibration for test and measurement instrument including asynchron...
- Patent number 11,041,884
- Issue date Jun 22, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for synchronizing multiple test and measurement...
- Patent number 11,002,764
- Issue date May 11, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Analog signal isolator
- Patent number 10,996,178
- Issue date May 4, 2021
- Tektronix, Inc.
- Jonathan S. Dandy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Back-drilled via attachment technique using a UV-cure conductive ad...
- Patent number 10,859,598
- Issue date Dec 8, 2020
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Linear and non-linear calibration for time interleaved digital-to-a...
- Patent number 10,735,013
- Issue date Aug 4, 2020
- Tektronix, Inc.
- Karen Hovakimyan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronic rotary switch
- Patent number 10,720,295
- Issue date Jul 21, 2020
- Tektronix, Inc.
- James D. Pileggi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Event activity trigger
- Patent number 10,680,588
- Issue date Jun 9, 2020
- Tektronix, Inc.
- Patrick A. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Trigger on final occurrence
- Patent number 10,365,300
- Issue date Jul 30, 2019
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Calibration for test and measurement instrument including asynchron...
- Patent number 10,330,705
- Issue date Jun 25, 2019
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sensor system
- Patent number 10,225,022
- Issue date Mar 5, 2019
- Tektronix, Inc.
- Richard A. Booman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Tri-mode probe with automatic skew adjustment
- Patent number 10,145,822
- Issue date Dec 4, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument having advanced triggering capability
- Patent number 10,094,868
- Issue date Oct 9, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 10,041,975
- Issue date Aug 7, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument including asynchronous time-interle...
- Patent number 9,859,908
- Issue date Jan 2, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Almost real-time sampling for ground-penetrating radar impulses
- Patent number 9,581,690
- Issue date Feb 28, 2017
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Calibration for test and measurement instrument including asynchron...
- Patent number 9,568,503
- Issue date Feb 14, 2017
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronically variable analog delay line
- Patent number 9,559,663
- Issue date Jan 31, 2017
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
ISOLATED TEST AND MEASUREMENT PROBE
- Publication number 20240369665
- Publication date Nov 7, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT WITH INTEGRATED ANALOG FRONT END
- Publication number 20240353447
- Publication date Oct 24, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POW...
- Publication number 20240353470
- Publication date Oct 24, 2024
- Tektronix, Inc.
- Niranjan R. Hegde
- G01 - MEASURING TESTING
Information Patent Application
COMPACT BALUN STRUCTURE FOR BROADBAND TIME-DOMAIN APPLICATIONS
- Publication number 20240339742
- Publication date Oct 10, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CURRENT SHUNT USING WIRE BUNDLE CONSTRUCTION
- Publication number 20240310413
- Publication date Sep 19, 2024
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
SPLIT-PATH MULTIPLEXING ACCESSORY FOR A TEST AND MEASUREMENT INSTRU...
- Publication number 20240159824
- Publication date May 16, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
OPTICALLY-IMPLEMENTED ANALOG MUX ACCESSORY FOR A TEST AND MEASUREME...
- Publication number 20240159797
- Publication date May 16, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- G02 - OPTICS
Information Patent Application
HIGH-IMPEDANCE DIFFERENTIAL FLEXIBLE PROBE TIP
- Publication number 20240118314
- Publication date Apr 11, 2024
- Tektronix, Inc.
- Julie A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CURRENT SHUNT WITH CANCELING MUTUAL INDUCTANCE
- Publication number 20240087776
- Publication date Mar 14, 2024
- Tektronix, Inc.
- Julie A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR
- Publication number 20240069065
- Publication date Feb 29, 2024
- Tektronix, Inc.
- JULIE A. CAMPBELL
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...
- Publication number 20240069094
- Publication date Feb 29, 2024
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Application
CURRENT MONITOR COMBINING A SHUNT RESISTOR WITH A ROGOWSKI COIL
- Publication number 20240061021
- Publication date Feb 22, 2024
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
CURRENT MONITOR COMBINING A SHUNT RESISTOR WITH A ROGOWSKI COIL
- Publication number 20240036079
- Publication date Feb 1, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED WAVEFORM ACQUISITIONS AND HISTOGRAMS USING GRAPHICS PROC...
- Publication number 20240027497
- Publication date Jan 25, 2024
- Tektronix, Inc.
- Andy K. Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMBINED SHUNT AND MULTI-SEGMENTED ROGOWSKI-COIL CURRENT SENSOR
- Publication number 20230417800
- Publication date Dec 28, 2023
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
ANALOG SIGNAL ISOLATOR
- Publication number 20230408424
- Publication date Dec 21, 2023
- Tektronix, Inc.
- Jonathan S. Dandy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SHUNT FOR USE IN BUSBAR-TO-MODULE CONNECTIONS
- Publication number 20230375596
- Publication date Nov 23, 2023
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
ISOLATED PROBE TIP
- Publication number 20220349917
- Publication date Nov 3, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR
- Publication number 20220326278
- Publication date Oct 13, 2022
- Tektronix, Inc.
- JULIE A. CAMPBELL
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION OF MAGNETIC FIELD SENSOR FOR CURRENT PROBE
- Publication number 20220317225
- Publication date Oct 6, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT DEVICES, SYSTEMS AND METHODS ASSOCIATED WITH A...
- Publication number 20220196701
- Publication date Jun 23, 2022
- Tektronix, Inc.
- Tyler B. Niles
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...
- Publication number 20220018896
- Publication date Jan 20, 2022
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SHUNT PROBE
- Publication number 20210318361
- Publication date Oct 14, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SYNCHRONIZING MULTIPLE TEST AND MEASUREMENT...
- Publication number 20210263076
- Publication date Aug 26, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
Analog Signal Isolator
- Publication number 20210255118
- Publication date Aug 19, 2021
- Tektronix, Inc.
- Jonathan S. Dandy
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY CONVERTER ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT
- Publication number 20210148951
- Publication date May 20, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
Automatic Probe Ground Connection Checking Techniques
- Publication number 20210088553
- Publication date Mar 25, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
EVENT ACTIVITY TRIGGER
- Publication number 20200304110
- Publication date Sep 24, 2020
- Tektronix, Inc.
- Patrick A. Smith
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEMS AND METHODS FOR SYNCHRONIZING MULTIPLE TEST AND MEASUREMENT...
- Publication number 20200256893
- Publication date Aug 13, 2020
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIGITAL SIGNAL PROCESSING WAVEFORM SYNTHESIS FOR FIXED SAMPLE RATE...
- Publication number 20200212923
- Publication date Jul 2, 2020
- Tektronix, Inc.
- Gregory A. Martin
- H03 - BASIC ELECTRONIC CIRCUITRY

Daniel G. Knierim

Person

Patents Grantslast 30 patents

Test and measurement instrument accessory with reconfigurable proce...

Precision, high bandwidth, switching attenuator

Analog signal isolator

Discrete offset dithered waveform averaging for high-fidelity digit...

Test and measurement devices, systems and methods associated with a...

Frequency converter accessory for a test and measurement instrument

Calibration of magnetic field sensor for current probe

Event activity trigger

Automatic probe ground connection checking techniques

Systems and methods for synchronizing multiple test and measurement...

Automatic probe ground connection checking techniques

Test and measurement devices, systems, and methods associated with...

Digital signal processing waveform synthesis for fixed sample rate...

Calibration for test and measurement instrument including asynchron...

Systems and methods for synchronizing multiple test and measurement...

Analog signal isolator

Back-drilled via attachment technique using a UV-cure conductive ad...

Linear and non-linear calibration for time interleaved digital-to-a...

Electronic rotary switch

Event activity trigger

Trigger on final occurrence

Calibration for test and measurement instrument including asynchron...

Electro-optic sensor system

Tri-mode probe with automatic skew adjustment

Test and measurement instrument having advanced triggering capability

Automatic probe ground connection checking techniques

Test and measurement instrument including asynchronous time-interle...

Almost real-time sampling for ground-penetrating radar impulses

Calibration for test and measurement instrument including asynchron...

Electronically variable analog delay line

Patents Applicationslast 30 patents

ISOLATED TEST AND MEASUREMENT PROBE

TEST AND MEASUREMENT INSTRUMENT WITH INTEGRATED ANALOG FRONT END

SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POW...

COMPACT BALUN STRUCTURE FOR BROADBAND TIME-DOMAIN APPLICATIONS

CURRENT SHUNT USING WIRE BUNDLE CONSTRUCTION

SPLIT-PATH MULTIPLEXING ACCESSORY FOR A TEST AND MEASUREMENT INSTRU...

OPTICALLY-IMPLEMENTED ANALOG MUX ACCESSORY FOR A TEST AND MEASUREME...

HIGH-IMPEDANCE DIFFERENTIAL FLEXIBLE PROBE TIP

CURRENT SHUNT WITH CANCELING MUTUAL INDUCTANCE

PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR

TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...

CURRENT MONITOR COMBINING A SHUNT RESISTOR WITH A ROGOWSKI COIL

CURRENT MONITOR COMBINING A SHUNT RESISTOR WITH A ROGOWSKI COIL

HIGH SPEED WAVEFORM ACQUISITIONS AND HISTOGRAMS USING GRAPHICS PROC...

COMBINED SHUNT AND MULTI-SEGMENTED ROGOWSKI-COIL CURRENT SENSOR

ANALOG SIGNAL ISOLATOR

SHUNT FOR USE IN BUSBAR-TO-MODULE CONNECTIONS

ISOLATED PROBE TIP

PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR

CALIBRATION OF MAGNETIC FIELD SENSOR FOR CURRENT PROBE

TEST AND MEASUREMENT DEVICES, SYSTEMS AND METHODS ASSOCIATED WITH A...

TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...

CURRENT SHUNT PROBE

SYSTEMS AND METHODS FOR SYNCHRONIZING MULTIPLE TEST AND MEASUREMENT...

Analog Signal Isolator

FREQUENCY CONVERTER ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT

Automatic Probe Ground Connection Checking Techniques

EVENT ACTIVITY TRIGGER

SYSTEMS AND METHODS FOR SYNCHRONIZING MULTIPLE TEST AND MEASUREMENT...

DIGITAL SIGNAL PROCESSING WAVEFORM SYNTHESIS FOR FIXED SAMPLE RATE...