Daniel Hassett

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Newtown Cunningham, IE

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Patents Grantslast 30 patents

Information Patent Grant
Sensor structure with multilayer top shield
- Patent number 9,454,979
- Issue date Sep 27, 2016
- Seagate Technology LLC
- Zhengqi Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistive sensor having synthetic antiferromagnetic layer in...
- Patent number 9,368,136
- Issue date Jun 14, 2016
- Seagate Technology LLC
- Zhengqi Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Data reader with magnetic seed lamination
- Patent number 9,165,570
- Issue date Oct 20, 2015
- Seagate Technology LLC
- Zhengqi Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Layered synthetic anti-ferromagnetic upper shield
- Patent number 9,087,525
- Issue date Jul 21, 2015
- Seagate Technology LLC
- Zhengqi Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic shield base lamination
- Patent number 8,867,175
- Issue date Oct 21, 2014
- Seagate Technology LLC
- Zhengqi Lu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MAGNETORESISTIVE SENSOR
- Publication number 20150243307
- Publication date Aug 27, 2015
- SEAGATE TECHNOLOGY LLC
- Zhengqi Lu
- G11 - INFORMATION STORAGE
Information Patent Application
LAYERED SYNTHETIC ANTI-FERROMAGNETIC UPPER SHIELD
- Publication number 20150116868
- Publication date Apr 30, 2015
- SEAGATE TECHNOLOGY LLC
- Zhengqi Lu
- G11 - INFORMATION STORAGE
Information Patent Application
Data Reader with Magnetic Seed Lamination
- Publication number 20150103438
- Publication date Apr 16, 2015
- Seagate Technology LLC
- Zhengqi Lu
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC SHIELD BASE LAMINATION
- Publication number 20140334040
- Publication date Nov 13, 2014
- SEAGATE TECHNOLOGY LLC
- Zhengqi Lu
- G01 - MEASURING TESTING
Information Patent Application
DATA READER WITH MAGNETIC SEED LAMINATION
- Publication number 20140218821
- Publication date Aug 7, 2014
- SEAGATE TECHNOLOGY LLC
- Zhengqi Lu
- G01 - MEASURING TESTING