Daniel Haxton

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Lake Forest Park, WA, US

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Patents Applicationslast 30 patents

Information Patent Application
OPTICAL AND X-RAY METROLOGY METHODS FOR PATTERNED SEMICONDUCTOR STR...
- Publication number 20250237619
- Publication date Jul 24, 2025
- KLA Corporation
- Daniel James Haxton
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL AND X-RAY METROLOGY METHODS FOR PATTERNED SEMICONDUCTOR STR...
- Publication number 20250146961
- Publication date May 8, 2025
- KLA Corporation
- Daniel James Haxton
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Measurement Of Semiconductor Structures Wit...
- Publication number 20240353760
- Publication date Oct 24, 2024
- KLA Corporation
- John J. Hench
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Scatterometry Based Measurements Of Memory Array Structures S...
- Publication number 20240302301
- Publication date Sep 12, 2024
- KLA Corporation
- Sandeep Inampudi
- H01 - BASIC ELECTRIC ELEMENTS