Daniel I. Some

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-detector defect detection system and a method for detecting d...
- Patent number 7,693,323
- Issue date Apr 6, 2010
- Applied Materials, Inc.
- Evgeni Levin
- G01 - MEASURING TESTING
Information Patent Grant
High speed laser scanning inspection system
- Patent number 7,589,835
- Issue date Sep 15, 2009
- Applied Materials, Israel, Ltd.
- Daniel Some
- G01 - MEASURING TESTING
Information Patent Grant
Laser inspection using diffractive elements for enhancement and sup...
- Patent number 7,433,053
- Issue date Oct 7, 2008
- Applied Materials, Israel, Ltd.
- Daniel Some
- G01 - MEASURING TESTING
Information Patent Grant
High speed laser scanning inspection system
- Patent number 7,365,836
- Issue date Apr 29, 2008
- Applied Materials, Israel, Ltd.
- Daniel Some
- G01 - MEASURING TESTING
Information Patent Grant
High speed laser scanning inspection system
- Patent number 7,359,045
- Issue date Apr 15, 2008
- Applied Materials, Israel, Ltd.
- Daniel Some
- G01 - MEASURING TESTING
Information Patent Grant
Optical technique for detecting buried defects in opaque films
- Patent number 7,027,142
- Issue date Apr 11, 2006
- Applied Materials, Israel, Ltd.
- Daniel Some
- G01 - MEASURING TESTING
Information Patent Grant
Full frame thermal pump probe technique for detecting subsurface de...
- Patent number 7,009,695
- Issue date Mar 7, 2006
- Applied Materials, Inc.
- Daniel I. Some
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical inspection of an object
- Patent number 7,006,224
- Issue date Feb 28, 2006
- Applied Materials, Israel, Ltd.
- Daniel Some
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for dual spot inspection of repetitive patterns
- Patent number 6,943,898
- Issue date Sep 13, 2005
- Applied Materials Israel, Ltd.
- Alexander Libinson
- G01 - MEASURING TESTING
Information Patent Grant
Variable angle illumination wafer inspection system
- Patent number 6,853,446
- Issue date Feb 8, 2005
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Laser scanning wafer inspection using nonlinear optical phenomena
- Patent number 6,791,099
- Issue date Sep 14, 2004
- Applied Materials, Inc.
- Daniel I. Some
- G01 - MEASURING TESTING
Information Patent Grant
Patterned wafer inspection using spatial filtering
- Patent number 6,686,602
- Issue date Feb 3, 2004
- Applied Materials, Inc.
- Daniel I. Some
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20110141462
- Publication date Jun 16, 2011
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED LASER SCANNING INSPECTION SYSTEM
- Publication number 20080212081
- Publication date Sep 4, 2008
- Daniel Some
- G01 - MEASURING TESTING
Information Patent Application
High speed laser scanning inspection system
- Publication number 20060132758
- Publication date Jun 22, 2006
- Daniel Some
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection system
- Publication number 20060012791
- Publication date Jan 19, 2006
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Application
Full frame thermal pump probe technique for detecting subsurface de...
- Publication number 20040196453
- Publication date Oct 7, 2004
- Applied Materials, Inc.
- Daniel I. Some
- G01 - MEASURING TESTING
Information Patent Application
Method and system for optical inspection of an object
- Publication number 20040125375
- Publication date Jul 1, 2004
- Applied Materials Israel Ltd.
- Daniel Some
- G01 - MEASURING TESTING
Information Patent Application
Laser inspection using diffractive elements for enhancement and sup...
- Publication number 20040027564
- Publication date Feb 12, 2004
- Applied Materials Israel, Inc.
- Daniel Some
- G01 - MEASURING TESTING
Information Patent Application
High speed laser scanning inspection system
- Publication number 20030227618
- Publication date Dec 11, 2003
- Applied Materials Israel Ltd.
- Daniel Some
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for dual spot inspection of repetitive patterns
- Publication number 20030210402
- Publication date Nov 13, 2003
- Applied Materials Israel Ltd.
- Alexander Libinson
- G02 - OPTICS
Information Patent Application
Optical technique for detecting buried defects in opaque films
- Publication number 20030206292
- Publication date Nov 6, 2003
- Applied Materials Israel Ltd.
- Daniel Some
- G01 - MEASURING TESTING
Information Patent Application
Muli-detector defect detection system and a method for detecting de...
- Publication number 20030174878
- Publication date Sep 18, 2003
- Evgeni Levin
- G01 - MEASURING TESTING
Information Patent Application
Patterned wafer inspection using spatial filtering
- Publication number 20030132405
- Publication date Jul 17, 2003
- Daniel I. Some
- G01 - MEASURING TESTING
Information Patent Application
Laser scanning wafer inspection using nonlinear optical phenomena
- Publication number 20020109110
- Publication date Aug 15, 2002
- APPLIED MATERIALS, INC.
- Daniel I. Some
- G01 - MEASURING TESTING

Daniel I. Some

Person

Patents Grantslast 30 patents

Multi-detector defect detection system and a method for detecting d...

High speed laser scanning inspection system

Laser inspection using diffractive elements for enhancement and sup...

High speed laser scanning inspection system

High speed laser scanning inspection system

Optical technique for detecting buried defects in opaque films

Full frame thermal pump probe technique for detecting subsurface de...

Method and system for optical inspection of an object

Apparatus and method for dual spot inspection of repetitive patterns

Variable angle illumination wafer inspection system

Laser scanning wafer inspection using nonlinear optical phenomena

Patterned wafer inspection using spatial filtering

Patents Applicationslast 30 patents

WAFER INSPECTION SYSTEM

HIGH SPEED LASER SCANNING INSPECTION SYSTEM

High speed laser scanning inspection system

Wafer inspection system

Full frame thermal pump probe technique for detecting subsurface de...

Method and system for optical inspection of an object

Laser inspection using diffractive elements for enhancement and sup...

High speed laser scanning inspection system

Apparatus and method for dual spot inspection of repetitive patterns

Optical technique for detecting buried defects in opaque films

Muli-detector defect detection system and a method for detecting de...

Patterned wafer inspection using spatial filtering

Laser scanning wafer inspection using nonlinear optical phenomena