Daniel J. Barnard

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Ames, IA, US

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Patents Grantslast 30 patents

Information Patent Grant
Microtexture region characterization systems and methods
- Patent number 11,933,767
- Issue date Mar 19, 2024
- RTX Corporation
- Yong Tian
- G01 - MEASURING TESTING
Information Patent Grant
Microtexture region characterization systems and methods
- Patent number 11,467,133
- Issue date Oct 11, 2022
- Raytheon Technologies Corporation
- Yong Tian
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspections and the display of inspection results
- Patent number 6,327,921
- Issue date Dec 11, 2001
- Iowa State University
- David K. Hsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROTEXTURE REGION CHARACTERIZATION SYSTEMS AND METHODS
- Publication number 20230003694
- Publication date Jan 5, 2023
- Raytheon Technologies Corporation
- Yong Tian
- G01 - MEASURING TESTING
Information Patent Application
MICROTEXTURE REGION CHARACTERIZATION SYSTEMS AND METHODS
- Publication number 20210072197
- Publication date Mar 11, 2021
- United Technologies Corporation
- Yong Tian
- G01 - MEASURING TESTING