Daniel J. Dangelo

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Phoenix, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for linked slot-level burn-in
- Patent number 7,550,964
- Issue date Jun 23, 2009
- Intel Corporation
- Daniel J. Dangelo
- G01 - MEASURING TESTING
Information Patent Grant
Temperature and voltage controlled integrated circuit processes
- Patent number 7,345,495
- Issue date Mar 18, 2008
- Intel Corporation
- Daniel J. Dangelo
- G01 - MEASURING TESTING
Information Patent Grant
System and method for linked slot-level burn-in
- Patent number 7,339,387
- Issue date Mar 4, 2008
- Intel Corporation
- Daniel J. Dangelo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for linked slot-level burn-in
- Patent number 7,292,023
- Issue date Nov 6, 2007
- Intel Corporation
- Daniel J. Dangelo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR LINKED SLOT-LEVEL BURN-IN
- Publication number 20080094095
- Publication date Apr 24, 2008
- Intel Corporation
- Daniel J. Dangelo
- G01 - MEASURING TESTING
Information Patent Application
Monitoring multiple electronic devices under test
- Publication number 20060290366
- Publication date Dec 28, 2006
- Intel Corporation
- Hon Lee Kon
- G01 - MEASURING TESTING
Information Patent Application
System and method for linked slot-level burn-in
- Publication number 20060000083
- Publication date Jan 5, 2006
- Daniel J. Dangelo
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for linked slot-level burn-in
- Publication number 20060001436
- Publication date Jan 5, 2006
- Daniel J. Dangelo
- G01 - MEASURING TESTING
Information Patent Application
Temperature and voltage controlled integrated circuit processes
- Publication number 20060002161
- Publication date Jan 5, 2006
- Daniel J. Dangelo
- G01 - MEASURING TESTING