Daniel J. Poindexter

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South Burlington, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Enhancing robustness of SOI substrate containing a buried N+ silico...
- Patent number 10,204,823
- Issue date Feb 12, 2019
- International Business Machines Corporation
- Stephen W. Bedell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip sensor for monitoring active circuits on integrated circuit...
- Patent number 10,191,108
- Issue date Jan 29, 2019
- GLOBALFOUNDRIES Inc.
- Gregory G. Freeman
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing robustness of SOI substrate containing a buried N+ silico...
- Patent number 9,922,866
- Issue date Mar 20, 2018
- International Business Machines Corporation
- Stephen W. Bedell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for an efficient modeling of the impact of device-level self...
- Patent number 9,552,455
- Issue date Jan 24, 2017
- GLOBALFOUNDRIES INC.
- Daniel J. Poindexter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low-voltage IC test for defect screening
- Patent number 9,285,417
- Issue date Mar 15, 2016
- GLOBALFOUNDRIES Inc.
- Daniel J. Poindexter
- G01 - MEASURING TESTING
Information Patent Grant
RF Coupling techniques
- Patent number 4,512,841
- Issue date Apr 23, 1985
- International Business Machines Corporation
- George F. Cunningham
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ENHANCING ROBUSTNESS OF SOI SUBSTRATE CONTAINING A BURIED N+ SILICO...
- Publication number 20180122688
- Publication date May 3, 2018
- International Business Machines Corporation
- Stephen W. Bedell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ON-CHIP SENSOR FOR MONITORING ACTIVE CIRCUITS ON INTEGRATED CIRCUIT...
- Publication number 20170146592
- Publication date May 25, 2017
- GLOBALFOUNDRIES INC.
- Gregory G. Freeman
- G01 - MEASURING TESTING
Information Patent Application
ENHANCING ROBUSTNESS OF SOI SUBSTRATE CONTAINING A BURIED N+ SILICO...
- Publication number 20170033001
- Publication date Feb 2, 2017
- International Business Machines Corporation
- Stephen W. Bedell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for an Efficient Modeling of the Impact of Device-Level Self...
- Publication number 20160224717
- Publication date Aug 4, 2016
- GLOBALFOUNDRIES INC.
- Daniel J. Poindexter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOW-VOLTAGE IC TEST FOR DEFECT SCREENING
- Publication number 20140184262
- Publication date Jul 3, 2014
- International Business Machines Corporation
- Daniel J. Poindexter
- G01 - MEASURING TESTING