Daniel Joseph Stillman

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Garland, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Lateral coupling enabled topside only dual-side testing of TSV die...
- Patent number 8,471,577
- Issue date Jun 25, 2013
- Texas Instruments Incorporated
- Daniel Joseph Stillman
- G01 - MEASURING TESTING
Information Patent Grant
Through carrier dual side loop-back testing of TSV die after die at...
- Patent number 8,344,749
- Issue date Jan 1, 2013
- Texas Instruments Incorporated
- Daniel Joseph Stillman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LATERAL COUPLING ENABLED TOPSIDE ONLY DUAL-SIDE TESTING OF TSV DIE...
- Publication number 20110304349
- Publication date Dec 15, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Daniel Joseph Stillman
- G01 - MEASURING TESTING
Information Patent Application
THROUGH CARRIER DUAL SIDE LOOP-BACK TESTING OF TSV DIE AFTER DIE AT...
- Publication number 20110298488
- Publication date Dec 8, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Daniel Joseph Stillman
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Device Crack-Deflecting Structure and Method
- Publication number 20090166810
- Publication date Jul 2, 2009
- Daniel Joseph Stillman
- H01 - BASIC ELECTRIC ELEMENTS