Daniel KOST

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Methods of error detection in fabrication processes
- Patent number 10,289,109
- Issue date May 14, 2019
- GLOBALFOUNDRIES Inc.
- Richard Good
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for semiconductor process control and monitoring...
- Patent number 8,849,615
- Issue date Sep 30, 2014
- GLOBALFOUNDRIES Inc.
- Daniel Kost
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for semiconductor process control and monitoring...
- Patent number 8,103,478
- Issue date Jan 24, 2012
- GLOBALFOUNDRIES Inc.
- Richard Good
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF ERROR DETECTION IN FABRICATION PROCESSES
- Publication number 20170097638
- Publication date Apr 6, 2017
- GLOBALFOUNDRIES INC.
- Richard GOOD
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM FOR SEMICONDUCTOR PROCESS CONTROL AND MONITORING...
- Publication number 20100198556
- Publication date Aug 5, 2010
- Daniel Kost
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM FOR SEMICONDUCTOR PROCESS CONTROL AND MONITORING...
- Publication number 20090276077
- Publication date Nov 5, 2009
- Richard Good
- G06 - COMPUTING CALCULATING COUNTING