Daniel L. Harris

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical testing device
- Patent number 7,268,533
- Issue date Sep 11, 2007
- Cascade Microtech, Inc.
- Daniel L. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Indexing rotatable chuck for a probe station
- Patent number 6,885,197
- Issue date Apr 26, 2005
- Cascade Microtech, Inc.
- Daniel L. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Optical testing device
- Patent number 6,836,135
- Issue date Dec 28, 2004
- Cascade Microtech, Inc.
- Daniel L. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Indexing rotatable chuck for a probe station
- Patent number 6,771,090
- Issue date Aug 3, 2004
- Cascade Microtech, Inc.
- Daniel L. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Indexing rotatable chuck for a probe station
- Patent number 6,483,336
- Issue date Nov 19, 2002
- Cascade Microtech, Inc.
- Daniel L. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Fixture for use in measuring an electrical characteristic of a pogo...
- Patent number 6,288,555
- Issue date Sep 11, 2001
- Credence Systems Corporation
- Daniel L. Harris
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT STRUCTURES WITH SUB-FIN ISOLATION
- Publication number 20250227993
- Publication date Jul 10, 2025
- Intel Corporation
- Willy RACHMADY
Information Patent Application
WAFER TRIM EDGE PROTECTION
- Publication number 20250218888
- Publication date Jul 3, 2025
- Intel Corporation
- Bradley PARKS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACKSIDE SELF-ALIGNED BACKBONE FOR FORKSHEET TRANSISTORS
- Publication number 20250204042
- Publication date Jun 19, 2025
- Intel Corporation
- Sukru YEMENICIOGLU
Information Patent Application
INTEGRATED CIRCUIT STRUCTURES WITH SUB-FIN ISOLATION
- Publication number 20240332301
- Publication date Oct 3, 2024
- Intel Corporation
- Willy RACHMADY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ETCH STOP LAYER FOR METAL GATE CUT
- Publication number 20240113106
- Publication date Apr 4, 2024
- Intel Corporation
- Sukru Yemenicioglu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical testing device
- Publication number 20070273387
- Publication date Nov 29, 2007
- Cascade Microtech, Inc.
- Daniel L. Harris
- G01 - MEASURING TESTING
Information Patent Application
Indexing rotatable chuck for a probe station
- Publication number 20050127927
- Publication date Jun 16, 2005
- Cascade Microtech, Inc.
- Daniel L. Harris
- G01 - MEASURING TESTING
Information Patent Application
Optical testing device
- Publication number 20050007581
- Publication date Jan 13, 2005
- Daniel L. Harris
- G01 - MEASURING TESTING
Information Patent Application
Indexing rotatable chuck for a probe station
- Publication number 20040217530
- Publication date Nov 4, 2004
- Daniel L. Harris
- G01 - MEASURING TESTING
Information Patent Application
Optical testing device
- Publication number 20030042889
- Publication date Mar 6, 2003
- Daniel L. Harris
- G01 - MEASURING TESTING
Information Patent Application
Indexing rotatable chuck for a probe station
- Publication number 20020153877
- Publication date Oct 24, 2002
- Daniel L. Harris
- G01 - MEASURING TESTING

Daniel L. Harris

Person

Patents Grantslast 30 patents

Optical testing device

Indexing rotatable chuck for a probe station

Optical testing device

Indexing rotatable chuck for a probe station

Indexing rotatable chuck for a probe station

Fixture for use in measuring an electrical characteristic of a pogo...

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT STRUCTURES WITH SUB-FIN ISOLATION

WAFER TRIM EDGE PROTECTION

BACKSIDE SELF-ALIGNED BACKBONE FOR FORKSHEET TRANSISTORS

INTEGRATED CIRCUIT STRUCTURES WITH SUB-FIN ISOLATION

ETCH STOP LAYER FOR METAL GATE CUT

Optical testing device

Indexing rotatable chuck for a probe station

Optical testing device

Indexing rotatable chuck for a probe station

Optical testing device

Indexing rotatable chuck for a probe station