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Daniel L. Reilly
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Mountain View, CA, US
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last 30 patents
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Patent Grant
Method and system for rapidly identifying silicon manufacturing def...
Patent number
8,701,072
Issue date
Apr 15, 2014
Altera Corporation
Daniel L. Reilly
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for rapidly identifying silicon manufacturing def...
Patent number
8,141,026
Issue date
Mar 20, 2012
Altera Corporation
Daniel L. Reilly
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for debugging semiconductor devices
Patent number
7,546,507
Issue date
Jun 9, 2009
Altera Corporation
Adam J. Wright
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for rapidly identifying silicon manufacturing def...
Patent number
7,401,317
Issue date
Jul 15, 2008
Altera Corporation
Daniel L. Reilly
G01 - MEASURING TESTING