Daniel LAM

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Plating methods for modular and/or ganged waveguides for automatic...
- Patent number 10,944,148
- Issue date Mar 9, 2021
- Advantest Corporation
- Don Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wave interface assembly for automatic test equipment for semiconduc...
- Patent number 10,393,772
- Issue date Aug 27, 2019
- Advantest Corporation
- Don Lee
- G01 - MEASURING TESTING
Information Patent Grant
Multiple waveguide structure with single flange for automatic test...
- Patent number 10,381,707
- Issue date Aug 13, 2019
- Advantest Corporation
- Don Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for socket power calibration with flexible pri...
- Patent number 10,371,716
- Issue date Aug 6, 2019
- Advantest Corporation
- Donald Lee
- G01 - MEASURING TESTING
Information Patent Grant
Integrated waveguide structure and socket structure for millimeter...
- Patent number 10,114,067
- Issue date Oct 30, 2018
- Advantest Corporation
- Daniel Lam
- G01 - MEASURING TESTING
Information Patent Grant
General universal device interface for automatic test equipment for...
- Patent number 9,921,266
- Issue date Mar 20, 2018
- Advantest Corporation
- Daniel Lam
- G01 - MEASURING TESTING
Information Patent Grant
Production-level modularized load board produced using a general un...
- Patent number 9,921,244
- Issue date Mar 20, 2018
- Advantest Corporation
- Daniel Lam
- G01 - MEASURING TESTING
Information Patent Grant
Handler with integrated receiver and signal path interface to tester
- Patent number 9,838,076
- Issue date Dec 5, 2017
- Advantest Corporation
- Daniel Lam
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR SOCKET POWER CALIBRATION WITH FLEXIBLE PRI...
- Publication number 20180003736
- Publication date Jan 4, 2018
- Advantest Corporation
- Donald LEE
- G01 - MEASURING TESTING
Information Patent Application
HANDLER WITH INTEGRATED RECEIVER AND SIGNAL PATH INTERFACE TO TESTER
- Publication number 20170279491
- Publication date Sep 28, 2017
- Advantest Corporation
- Daniel LAM
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MULTIPLE WAVEGUIDE STRUCTURE WITH SINGLE FLANGE FOR AUTOMATIC TEST...
- Publication number 20170229753
- Publication date Aug 10, 2017
- Advantest Corporation
- Don LEE
- G01 - MEASURING TESTING
Information Patent Application
PLATING METHODS FOR MODULAR AND/OR GANGED WAVEGUIDES FOR AUTOMATIC...
- Publication number 20170229757
- Publication date Aug 10, 2017
- Advantest Corporation
- Don LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVE INTERFACE ASSEMBLY FOR AUTOMATIC TEST EQUIPMENT FOR SEMICONDUC...
- Publication number 20170229754
- Publication date Aug 10, 2017
- Advantest Corporation
- Don LEE
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED WAVEGUIDE STRUCTURE AND SOCKET STRUCTURE FOR MILLIMETER...
- Publication number 20170227598
- Publication date Aug 10, 2017
- Advantest Corporation
- Daniel LAM
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Plating methods for modular and/or ganged waveguides for automatic...

Wave interface assembly for automatic test equipment for semiconduc...

Multiple waveguide structure with single flange for automatic test...

Method and apparatus for socket power calibration with flexible pri...

Integrated waveguide structure and socket structure for millimeter...

General universal device interface for automatic test equipment for...

Production-level modularized load board produced using a general un...

Handler with integrated receiver and signal path interface to tester

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR SOCKET POWER CALIBRATION WITH FLEXIBLE PRI...

HANDLER WITH INTEGRATED RECEIVER AND SIGNAL PATH INTERFACE TO TESTER

MULTIPLE WAVEGUIDE STRUCTURE WITH SINGLE FLANGE FOR AUTOMATIC TEST...

PLATING METHODS FOR MODULAR AND/OR GANGED WAVEGUIDES FOR AUTOMATIC...

WAVE INTERFACE ASSEMBLY FOR AUTOMATIC TEST EQUIPMENT FOR SEMICONDUC...

INTEGRATED WAVEGUIDE STRUCTURE AND SOCKET STRUCTURE FOR MILLIMETER...