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Daniel M. Boyne
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Austin, TX, US
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last 30 patents
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Patent Grant
Self-aligned, lateral diffusion barrier in metal lines to eliminate...
Patent number
6,597,067
Issue date
Jul 22, 2003
International Business Machines Corporation
Glenn Allen Biery
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Dual channel d.c. low noise measurement system and test methodology
Patent number
5,563,517
Issue date
Oct 8, 1996
International Business Machines Corporation
Glenn A. Biery
G01 - MEASURING TESTING
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Patent Grant
Method of making self-aligned, lateral diffusion barrier in metal l...
Patent number
5,470,788
Issue date
Nov 28, 1995
International Business Machines Corporation
Glenn A. Biery
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Dual channel D.C. low noise measurement system and test methodology
Patent number
5,434,385
Issue date
Jul 18, 1995
International Business Machines Corporation
Glenn A. Biery
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
TEST VEHICLES FOR ENCAPSULATED SEMICONDUCTOR DEVICE PACKAGES
Publication number
20130330846
Publication date
Dec 12, 2013
Jinbang Tang
G01 - MEASURING TESTING